Senda; Takeshi
Patent Applications and Registrations
Patent applications and USPTO patent grants for Senda; Takeshi.The latest application filed is for "silicon wafer and method for manufacturing the same".
- Senda; Takeshi - Niigata JP
- Senda; Takeshi - Tokyo JP
- Senda; Takeshi - Kitakanbara-gun JP
- Senda; Takeshi - Shibata JP
- Senda; Takeshi - Kitakanbaragun JP
| Patent | Date |
|---|---|
| Silicon wafer and method for manufacturing the same Grant 10,141,180 - Araki , et al. Nov | 2018-11-27 |
| Laser joining method Grant 9,421,712 - Arai , et al. August 23, 2 | 2016-08-23 |
| Thermal treatment method of silicon wafer and silicon wafer Grant 9,059,099 - Senda , et al. June 16, 2 | 2015-06-16 |
| Silicon wafer and method for heat-treating silicon wafer Grant 8,999,864 - Senda , et al. April 7, 2 | 2015-04-07 |
| Silicon Wafer And Method For Manufacturing The Same App 20150044422 - ARAKI; Koji ; et al. | 2015-02-12 |
| Laser Joining Method App 20140332157 - Arai; Satoshi ; et al. | 2014-11-13 |
| Method of manufacturing single crystal silicon wafer from ingot grown by Czocharlski process with rapid heating/cooling process Grant 8,476,149 - Isogai , et al. July 2, 2 | 2013-07-02 |
| Method For Heat-treating Silicon Wafer App 20130078588 - Senda; Takeshi ; et al. | 2013-03-28 |
| Method for heat treating a silicon wafer Grant 8,399,341 - Senda , et al. March 19, 2 | 2013-03-19 |
| Thermal Treatment Method Of Silicon Wafer And Silicon Wafer App 20120241912 - SENDA; Takeshi ; et al. | 2012-09-27 |
| Method of heat treating silicon wafer Grant 8,252,700 - Senda , et al. August 28, 2 | 2012-08-28 |
| Method For Heat Treating A Silicon Wafer App 20120184091 - Senda; Takeshi ; et al. | 2012-07-19 |
| Silicon Wafer And Method For Heat-treating Silicon Wafer App 20120139088 - Senda; Takeshi ; et al. | 2012-06-07 |
| Manufacturing method for silicon wafer Grant 7,977,219 - Isogai , et al. July 12, 2 | 2011-07-12 |
| Method of heat treating silicon wafer App 20100197146 - Senda; Takeshi ; et al. | 2010-08-05 |
| Surface inspection apparatus and surface inspection method for strained silicon wafer Grant 7,679,730 - Takano , et al. March 16, 2 | 2010-03-16 |
| Manufacturing Method For Silicon Wafer App 20100055884 - Isogai; Hiromichi ; et al. | 2010-03-04 |
| Silicon Wafer, Method For Manufacturing The Same And Method For Heat-treating The Same App 20100038757 - Isogai; Hiromichi ; et al. | 2010-02-18 |
| Method Of Manufacturing Semiconductor Substrate App 20090004825 - SENDA; Takeshi ; et al. | 2009-01-01 |
| Semiconductor Substrate And Manufacturing Method Thereof App 20080164572 - Toyoda; Eiji ; et al. | 2008-07-10 |
| Silicon Wafer App 20070240628 - Watanabe; Takashi ; et al. | 2007-10-18 |
| Manufacturing method for strained silicon wafer Grant 7,250,357 - Senda , et al. July 31, 2 | 2007-07-31 |
| Manufacturing method for strained silicon wafer Grant 7,247,583 - Kurita , et al. July 24, 2 | 2007-07-24 |
| Method of manufacturing silicon wafer App 20070068447 - Izunome; Koji ; et al. | 2007-03-29 |
| Manufacturing method for a silicon substrate having strained layer Grant 7,060,597 - Kurita , et al. June 13, 2 | 2006-06-13 |
| Manufacturing method for strained silicon wafer App 20060057856 - Senda; Takeshi ; et al. | 2006-03-16 |
| Manufacturing method for strained silicon wafer App 20050170664 - Kurita, Hisatsugu ; et al. | 2005-08-04 |
| Manufacturing method for a silicon substrate having strained layer App 20040235274 - Kurita, Hisatsugu ; et al. | 2004-11-25 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.
| 