Seligson; Joel L.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Seligson; Joel L..The latest application filed is for "optics symmetrization for metrology".

Company Profile

0.12.7

Seligson; Joel L. - Misgav N/A IL
Seligson; Joel L. - D.N. Misgav IL
Seligson; Joel L. - Manof IL
Seligson; Joel L. - Rochester NY

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Optics symmetrization for metrology Grant 9,164,397 - Manassen , et al. October 20, 2	2015-10-20
Optics Symmetrization For Metrology App 20120033226 - Manassen; Amnon ; et al.	2012-02-09
Apparatus and methods for determining overlay and uses of same Grant 7,876,438 - Ghinovker , et al. January 25, 2	2011-01-25
Apparatus and Methods for Determining Overlay and Uses of Same App 20100005442 - Ghinovker; Mark ; et al.	2010-01-07
Apparatus and methods for determining overlay and uses of same Grant 7,608,468 - Ghinovker , et al. October 27, 2	2009-10-27
Order selected overlay metrology Grant 7,528,941 - Kandel , et al. May 5, 2	2009-05-05
Continuously varying offset mark and methods of determining overlay Grant 7,440,105 - Adel , et al. October 21, 2	2008-10-21
Use of overlay diagnostics for enhanced automatic process control Grant 7,310,789 - Seligson , et al. December 18, 2	2007-12-18
Order Selected Overlay Metrology App 20070279630 - Kandel; Daniel ; et al.	2007-12-06
Use of overlay diagnostics for enhanced automatic process control App 20060280357 - Seligson; Joel L. ; et al.	2006-12-14
Use of overlay diagnostics for enhanced automatic process control Grant 7,111,256 - Seligson , et al. September 19, 2	2006-09-19
Continuously varying offset mark and methods of determining overlay App 20050195398 - Adel, Michael E. ; et al.	2005-09-08
Use of overlay diagnostics for enhanced automatic process control Grant 6,928,628 - Seligson , et al. August 9, 2	2005-08-09
Use of overlay diagnostics for enhanced automatic process control App 20040038455 - Seligson, Joel L. ; et al.	2004-02-26
Use of overlay diagnostics for enhanced automatic process control App 20040040003 - Seligson, Joel L. ; et al.	2004-02-26
Autofocusing apparatus and method for high resolution microscope system Grant 6,172,349 - Katz , et al. January 9, 2	2001-01-09
Imaging apparatus which includes a light-valve array having electrostatically deflectable elements Grant 4,805,038 - Seligson February 14, 1	1989-02-14
Imaging apparatus Grant 4,731,670 - Allen , et al. March 15, 1	1988-03-15

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.