Seligson; Joel
Patent Applications and Registrations
Patent applications and USPTO patent grants for Seligson; Joel.The latest application filed is for "structured illumination for contrast enhancement in overlay metrology".
- Seligson; Joel - D.N. Misgav IL
- Seligson; Joel - Misgav IL
| Patent | Date |
|---|---|
| Structured illumination for contrast enhancement in overlay metrology Grant 10,274,425 - Seligson , et al. | 2019-04-30 |
| Near field metrology Grant 10,261,014 - Sapiens , et al. | 2019-04-16 |
| Compound objectives for imaging and scatterometry overlay Grant 10,139,528 - Seligson , et al. Nov | 2018-11-27 |
| Structured Illumination for Contrast Enhancement in Overlay Metrology App 20170307523 - Seligson; Joel ; et al. | 2017-10-26 |
| Structured illumination for contrast enhancement in overlay metrology Grant 9,645,079 - Seligson , et al. May 9, 2 | 2017-05-09 |
| Method and apparatus for lithographic mask production Grant 9,442,369 - Shur , et al. September 13, 2 | 2016-09-13 |
| Structured Illumination for Contrast Enhancement in Overlay Metrology App 20160003735 - Seligson; Joel ; et al. | 2016-01-07 |
| Structured illumination for contrast enhancement in overlay metrology Grant 9,104,120 - Seligson , et al. August 11, 2 | 2015-08-11 |
| Near Field Metrology App 20150198524 - Sapiens; Noam ; et al. | 2015-07-16 |
| Metrology systems and methods Grant 9,080,971 - Kandel , et al. July 14, 2 | 2015-07-14 |
| Metrology Systems and Methods App 20150036142 - Kandel; Daniel ; et al. | 2015-02-05 |
| Flexible scatterometry metrology system and method Grant 8,908,175 - Kandel , et al. December 9, 2 | 2014-12-09 |
| Discrete polarization scatterometry Grant 8,896,832 - Hill , et al. November 25, 2 | 2014-11-25 |
| Metrology systems and methods Grant 8,873,054 - Kandel , et al. October 28, 2 | 2014-10-28 |
| Illumination control Grant 8,681,413 - Manassen , et al. March 25, 2 | 2014-03-25 |
| Overlay metrology by pupil phase analysis Grant 8,582,114 - Manassen , et al. November 12, 2 | 2013-11-12 |
| Metrology Systems and Methods App 20130229661 - Kandel; Daniel ; et al. | 2013-09-05 |
| Metrology systems and methods Grant 8,441,639 - Kandel , et al. May 14, 2 | 2013-05-14 |
| Overlay Metrology By Pupil Phase Analysis App 20130044331 - Manassen; Amnon ; et al. | 2013-02-21 |
| Illumination Control App 20120327503 - Manassen; Amnon ; et al. | 2012-12-27 |
| Structured Illumination For Contrast Enhancement In Overlay Metrology App 20120206729 - Seligson; Joel ; et al. | 2012-08-16 |
| Discrete Polarization Scatterometry App 20110310388 - Hill; Andrew V. ; et al. | 2011-12-22 |
| Metrology Systems And Methods App 20110069312 - Kandel; Daniel ; et al. | 2011-03-24 |
| Method and apparatus for increasing metrology or inspection tool throughput Grant 7,724,375 - Novikov , et al. May 25, 2 | 2010-05-25 |
| Optical gain approach for enhancement of overlay and alignment systems performance Grant 7,602,491 - Kandel , et al. October 13, 2 | 2009-10-13 |
| Optical Gain Approach For Enhancement Of Overlay And Alignment Systems Performance App 20080266561 - Kandel; Daniel ; et al. | 2008-10-30 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.
| 