Sekine; Akihiko
Patent Applications and Registrations
Patent applications and USPTO patent grants for Sekine; Akihiko.The latest application filed is for "optical property measurement apparatus and optical property measurement method".
- Sekine; Akihiko - Inagi JP
- SEKINE; Akihiko - Inagi-shi JP
- Sekine; Akihiko - Tokyo N/A JP
- Sekine; Akihiko - Itabashi-ku JP
- Sekine, Akihiko - Tokyo-to JP
| Patent | Date |
|---|---|
| Optical property measurement apparatus and optical property measurement method Grant 9,476,693 - Sekine , et al. October 25, 2 | 2016-10-25 |
| Fundus observation apparatus and fundus image analyzing apparatus Grant 9,456,745 - Matsumoto , et al. October 4, 2 | 2016-10-04 |
| Optical Property Measurement Apparatus And Optical Property Measurement Method App 20150323304 - SEKINE; Akihiko ; et al. | 2015-11-12 |
| Fundus Observation Apparatus And Fundus Image Analyzing Apparatus App 20150116660 - Matsumoto; Akiko ; et al. | 2015-04-30 |
| Ophthalmic observation apparatus Grant 8,724,870 - Sekine , et al. May 13, 2 | 2014-05-13 |
| Method Of Controlling Ophthalmic Observation Apparatus And Ophthalmic Observation Apparatus App 20140078466 - SEKINE; Akihiko ; et al. | 2014-03-20 |
| Ophthalmic Observation Apparatus App 20120121158 - Sekine; Akihiko ; et al. | 2012-05-17 |
| Mask-defect inspecting apparatus with movable focusing lens Grant 7,760,349 - Sekine , et al. July 20, 2 | 2010-07-20 |
| Mask defect inspection apparatus Grant 7,551,273 - Sekine , et al. June 23, 2 | 2009-06-23 |
| Pattern inspection method Grant 7,522,276 - Tojo , et al. April 21, 2 | 2009-04-21 |
| Mask defect inspection apparatus App 20080204723 - Sekine; Akihiko ; et al. | 2008-08-28 |
| Pattern Inspection Method App 20080151230 - Tojo; Toru ; et al. | 2008-06-26 |
| Mask defect inspection apparatus Grant 7,379,176 - Sekine , et al. May 27, 2 | 2008-05-27 |
| Pattern inspection apparatus Grant 7,372,560 - Tojo , et al. May 13, 2 | 2008-05-13 |
| Surface inspection apparatus Grant 7,348,585 - Miyakawa , et al. March 25, 2 | 2008-03-25 |
| Surface inspection method and surface inspection apparatus Grant 7,245,366 - Miyakawa , et al. July 17, 2 | 2007-07-17 |
| Method for inspecting surface and apparatus for inspecting it Grant 7,154,597 - Miyakawa , et al. December 26, 2 | 2006-12-26 |
| Surface inspection apparatus App 20050270522 - Miyakawa, Kazuhiro ; et al. | 2005-12-08 |
| Mask defect inspection apparatus App 20050213083 - Sekine, Akihiko ; et al. | 2005-09-29 |
| Mask-defect inspecting apparatus App 20050213084 - Sekine, Akihiko ; et al. | 2005-09-29 |
| Method for inspecting surface and apparatus for inspecting it App 20040263835 - Miyakawa, Kazuhiro ; et al. | 2004-12-30 |
| Surface inspection method and surface inspection apparatus App 20040252295 - Miyakawa, Kazuhiro ; et al. | 2004-12-16 |
| Pattern inspection apparatus App 20040252296 - Tojo, Toru ; et al. | 2004-12-16 |
| Surface inspection apparatus App 20040169853 - Iwa, Yoichiro ; et al. | 2004-09-02 |
| Laser light source device and surface inspection apparatus using it App 20040095572 - Iwa, Yoichiro ; et al. | 2004-05-20 |
| Surface inspection apparatus Grant 6,104,481 - Sekine , et al. August 15, 2 | 2000-08-15 |
| Intraocular length measuring instrument Grant 5,141,302 - Arai , et al. August 25, 1 | 1992-08-25 |
| Laser beam scanning type eye fundus observing device Grant 5,088,811 - Hideshima , et al. February 18, 1 | 1992-02-18 |
| Laser beam scanning type ophthalmological instrument Grant 4,968,130 - Hideshima , et al. November 6, 1 | 1990-11-06 |
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