Sekihara; Isamu

Patent Applications and Registrations

Patent applications and USPTO patent grants for Sekihara; Isamu.The latest application filed is for "charged particle beam device and sample preparation method".

Company Profile

1.14.13

Sekihara; Isamu - Tokyo JP
Sekihara; Isamu - Hitachinaka N/A JP
Sekihara; Isamu - Fussa JP
Sekihara; Isamu - Fusa JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Charged particle beam device and sample preparation method Grant 9,362,088 - Sato , et al. June 7, 2	2016-06-07
Charged particle beam device Grant 9,330,883 - Nanri , et al. May 3, 2	2016-05-03
Charged Particle Beam Device and Sample Preparation Method App 20150255250 - Sato; Takahiro ; et al.	2015-09-10
Charged Particle Beam Device App 20150014529 - Nanri; Terutaka ; et al.	2015-01-15
Charged particle beam device, position specification method used for charged particle beam device, and program Grant 8,912,487 - Sakamoto , et al. December 16, 2	2014-12-16
Focused ion beam device and focused ion beam processing method Grant 8,552,397 - Madokoro , et al. October 8, 2	2013-10-08
Charged Particle Beam Apparatus And Method Of Irradiating Charged Particle Beam App 20130248733 - Nomaguchi; Tsunenori ; et al.	2013-09-26
Charged particle beam apparatus, and sample processing and observation method Grant 8,455,824 - Muto , et al. June 4, 2	2013-06-04
Charged Particle Beam Apparatus, And Sample Processing And Observation Method App 20120326028 - MUTO; Hiroyuki ; et al.	2012-12-27
Focused Ion Beam Device and Focused Ion Beam Processing Method App 20120235055 - Madokoro; Yuichi ; et al.	2012-09-20
Charged Particle Beam Device, Position Specification Method Used for Charged Particle Beam Device, and Program App 20120211652 - Sakamoto; Kunio ; et al.	2012-08-23
Sample inspection apparatus Grant 7,989,766 - Nara , et al. August 2, 2	2011-08-02
Refilling method by ion beam, instrument for fabrication and observation by ion beam, and manufacturing method of electronic device Grant 7,709,062 - Shichi , et al. May 4, 2	2010-05-04
Sample Inspection Apparatus App 20090250610 - NARA; Yasuhiko ; et al.	2009-10-08
Charged Particle Beam Apparatus, And Sample Processing And Observation Method App 20090020698 - MUTO; Hiroyuki ; et al.	2009-01-22
Probe driving method, and probe apparatus Grant 7,301,146 - Tomimatsu , et al. November 27, 2	2007-11-27
Probe driving method, and probe apparatus App 20050269511 - Tomimatsu, Satoshi ; et al.	2005-12-08
Apparatus for inspecting defects of devices and method of inspecting defects Grant 6,970,004 - Ishitani , et al. November 29, 2	2005-11-29
Probe driving method, and probe apparatus Grant 6,960,765 - Tomimatsu , et al. November 1, 2	2005-11-01
Apparatus for inspecting defects of devices and method of inspecting defects App 20040178811 - Ishitani, Tohru ; et al.	2004-09-16
Apparatus for detecting defect in device and method of detecting defect Grant 6,734,687 - Ishitani , et al. May 11, 2	2004-05-11
Refilling method by ion beam, instrument for fabrication and observation by ion beam, and manufacturing method of electron device App 20030198755 - Shichi, Hiroyasu ; et al.	2003-10-23
Probe driving method, and probe apparatus App 20030184332 - Tomimatsu, Satoshi ; et al.	2003-10-02

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