| Patent | Date |
|---|
Sstr-targeted Conjugates And Formulations Thereof
App 20220257766 - ZHOROV; Eugene ; et al. | 2022-08-18 |
High Resolution Electron Beam Apparatus With Dual-aperture Schemes
App 20220254667 - Jiang; Xinrong ; et al. | 2022-08-11 |
Electron beam system for inspection and review of 3D devices
Grant 11,335,608 - Jiang , et al. May 17, 2 | 2022-05-17 |
Space charge insensitive electron gun designs
Grant 11,302,510 - Sears , et al. April 12, 2 | 2022-04-12 |
Field curvature correction for multi-beam inspection systems
Grant 11,302,511 - Brodie , et al. April 12, 2 | 2022-04-12 |
Electron Source With Magnetic Suppressor Electrode
App 20220108862 - Chubun; Nikolai ; et al. | 2022-04-07 |
Sstr-targeted Conjugates And Particles And Formulations Thereof
App 20220054647 - Shinde; Rajesh R. ; et al. | 2022-02-24 |
SSTR-targeted conjugates and particles and formulations thereof
Grant 11,213,590 - Shinde , et al. January 4, 2 | 2022-01-04 |
Electron Beam System For Inspection And Review Of 3d Devices
App 20210327770 - Jiang; Xinrong ; et al. | 2021-10-21 |
Charge control device for a system with multiple electron beams
Grant 11,087,950 - Sears , et al. August 10, 2 | 2021-08-10 |
Micro stigmator array for multi electron beam system
Grant 11,056,312 - Jiang , et al. July 6, 2 | 2021-07-06 |
Magnetically microfocused electron emission source
Grant 11,037,753 - Sears June 15, 2 | 2021-06-15 |
Pharmaceutical Compositions With Reduced Tert-butanol Levels
App 20210169871 - BILODEAU; Mark T. ; et al. | 2021-06-10 |
High resolution electron energy analyzer
Grant 10,964,522 - Jiang , et al. March 30, 2 | 2021-03-30 |
Scanning electron microscope objective lens calibration using X-Y voltages iteratively determined from images obtained using said voltages
Grant 10,790,114 - Honjo , et al. September 29, 2 | 2020-09-29 |
Sstr-targeted Conjugates And Formulations Thereof
App 20200281934 - Shinde; Rajesh R. ; et al. | 2020-09-10 |
Method and system for edge-of-wafer inspection and review
Grant 10,770,258 - Jiang , et al. Sep | 2020-09-08 |
Deflection array apparatus for multi-electron beam system
Grant 10,748,739 - Jiang , et al. A | 2020-08-18 |
Targeted Therapeutics
App 20200230126 - Alland; Leila ; et al. | 2020-07-23 |
Joint Electron-Optical Columns for Flood-Charging and Image-Forming in Voltage Contrast Wafer Inspections
App 20200194223 - Jiang; Xinrong ; et al. | 2020-06-18 |
Detection and Correction of System Responses in Real-Time
App 20200194224 - Stoschus; Henning ; et al. | 2020-06-18 |
Deflection Array Apparatus for Multi-Electron Beam System
App 20200118784 - Jiang; Xinrong ; et al. | 2020-04-16 |
Magnetically Microfocused Electron Emission Source
App 20200013579 - Sears; Christopher | 2020-01-09 |
High Resolution Electron Energy Analyzer
App 20190378705 - Jiang; Xinrong ; et al. | 2019-12-12 |
Charge Control Device For A System With Multiple Electron Beams
App 20190371566 - Sears; Christopher ; et al. | 2019-12-05 |
Space Charge Insensitive Electron Gun Designs
App 20190371564 - Sears; Christopher ; et al. | 2019-12-05 |
Method and system for charge control for imaging floating metal structures on non-conducting substrates
Grant 10,460,903 - Hegde , et al. Oc | 2019-10-29 |
Sstr-targeted Conjugates And Particles And Formulations Thereof
App 20190262460 - Shinde; Rajesh R. ; et al. | 2019-08-29 |
Position Feedback For Multi-beam Particle Detector
App 20190227010 - Brodie; Alan D. ; et al. | 2019-07-25 |
Multi-column scanning electron microscopy system
Grant 10,354,832 - Haynes , et al. July 16, 2 | 2019-07-16 |
Position feedback for multi-beam particle detector
Grant 10,338,013 - Brodie , et al. | 2019-07-02 |
Particle beam inspector with independently-controllable beams
Grant 10,276,346 - Duffy , et al. | 2019-04-30 |
Method and system for aberration correction in an electron beam system
Grant 10,224,177 - Sears , et al. | 2019-03-05 |
Scanning Electron Microscope Objective Lens Calibration
App 20190004298 - Honjo; Ichiro ; et al. | 2019-01-03 |
Method and System for Edge-of-Wafer Inspection and Review
App 20190006143 - Jiang; Xinrong ; et al. | 2019-01-03 |
Multi-Column Scanning Electron Microscopy System
App 20180358200 - Haynes; Robert ; et al. | 2018-12-13 |
Electron beam apparatus with high resolutions
Grant 10,096,447 - Jiang , et al. October 9, 2 | 2018-10-09 |
Method and system for aberration correction in an electron beam system
Grant 10,090,131 - Jiang , et al. October 2, 2 | 2018-10-02 |
Method and system for edge-of-wafer inspection and review
Grant 10,056,224 - Jiang , et al. August 21, 2 | 2018-08-21 |
Method and System for Aberration Correction in an Electron Beam System
App 20180158644 - Jiang; Xinrong ; et al. | 2018-06-07 |
Extractor electrode for electron source
Grant 9,934,933 - Hordon , et al. April 3, 2 | 2018-04-03 |
System and method for drift compensation on an electron beam based characterization tool
Grant 9,892,885 - Laske , et al. February 13, 2 | 2018-02-13 |
Heat-spreading blanking system for high throughput electron beam apparatus
Grant 9,881,764 - Jiang , et al. January 30, 2 | 2018-01-30 |
Method and System for Charge Control for Imaging Floating Metal Structures on Non-Conducting Substrates
App 20170287675 - Hegde; Arjun ; et al. | 2017-10-05 |
System and Method for Drift Compensation on an Electron Beam Based Characterization Tool
App 20170278666 - Laske; Frank ; et al. | 2017-09-28 |
Field Curvature Correction for Multi-Beam Inspection Systems
App 20170229279 - Brodie; Alan ; et al. | 2017-08-10 |
Heat-spreading Blanking System For High Throughput Electron Beam Apparatus
App 20170200581 - Jiang; Xinrong ; et al. | 2017-07-13 |
Method and system for reducing charging artifacts in scanning electron microscopy images
Grant 9,653,257 - Sears , et al. May 16, 2 | 2017-05-16 |
Method and System for Edge-of-Wafer Inspection and Review
App 20170047193 - Jiang; Xinrong ; et al. | 2017-02-16 |
Apparatus and method for optical inspection, magnetic field and height mapping
Grant 9,513,230 - Gerling , et al. December 6, 2 | 2016-12-06 |
Method and System for Aberration Correction in an Electron Beam System
App 20160329189 - Sears; Christopher ; et al. | 2016-11-10 |
Method and System for Reducing Charging Artifacts in Scanning Electron Microscopy Images
App 20160260576 - Sears; Christopher ; et al. | 2016-09-08 |
Wafer grounding using localized plasma source
Grant 9,232,626 - Sears January 5, 2 | 2016-01-05 |
Asymmetric electrostatic quadrupole deflector for improved field uniformity
Grant 9,171,694 - Sears October 27, 2 | 2015-10-27 |
Inspection site preparation
Grant 9,165,742 - Simmons , et al. October 20, 2 | 2015-10-20 |
Asymmetric Electrostatic Quadrupole Deflector for Improved Field Uniformity
App 20150144785 - Sears; Christopher | 2015-05-28 |
Wafer Grounding Using Localized Plasma Source
App 20150123542 - Sears; Christopher | 2015-05-07 |
Apparatus And Method For Optical Inspection, Magnetic Field And Height Mapping
App 20140218503 - Gerling; John ; et al. | 2014-08-07 |
Automated hotfix handling model
Grant 8,713,554 - Chopra , et al. April 29, 2 | 2014-04-29 |
Permanent magnet lens array
Grant 8,698,094 - Sears , et al. April 15, 2 | 2014-04-15 |
Auger elemental identification algorithm
Grant 8,658,973 - Neil , et al. February 25, 2 | 2014-02-25 |
Background reduction system including louver
Grant 8,633,457 - Nasser-Ghodsi , et al. January 21, 2 | 2014-01-21 |
Auger Elemental Identification Algorithm
App 20130341504 - Neill; Mark ; et al. | 2013-12-26 |
Charged-particle energy analyzer
Grant 8,421,030 - Shadman , et al. April 16, 2 | 2013-04-16 |
Method for Diagnosing or Determining the Prognosis of Colorectal Cancer (CRC) Using Novel Autoantigens: Gene Expression Guided Autoantigen Discovery
App 20130040839 - Lim; Mark J. ; et al. | 2013-02-14 |
Method for Diagnosing or Determining the Prognosis of Colorectal Cancer (CRC) Using Novel Autoantigens: Gene Expression Guided Autoantigen Discovery
App 20130022987 - Lim; Mark J. ; et al. | 2013-01-24 |
Background Reduction System Including Louver
App 20130001417 - Nasser-Ghodsi; Mehran ; et al. | 2013-01-03 |
Compositions And Methods For Cancer Testing
App 20120077198 - Wyhs; Nicolas ; et al. | 2012-03-29 |
Gene expression markers for colorectal cancer prognosis
App 20120004127 - Sears; Christopher ; et al. | 2012-01-05 |
Method Of Processing Data Using An Algorithm For Linear Extension Of Threshold In Quantitative Real-time Pcr Data
App 20110301855 - Sears; Christopher ; et al. | 2011-12-08 |
Charged-particle Energy Analyzer
App 20110168886 - Shadman; Khashayar ; et al. | 2011-07-14 |
| 