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Methods and apparatus for detecting corrosion of conductive objects
Grant 11,378,511 - Peng , et al. July 5, 2 | 2022-07-05 |
Methods and apparatus for dynamical control of radial uniformity in microwave chambers
Grant 11,355,317 - Kobayashi , et al. June 7, 2 | 2022-06-07 |
Methods and apparatus for dynamical control of radial uniformity with two-story microwave cavities
Grant 11,348,783 - Kobayashi , et al. May 31, 2 | 2022-05-31 |
Methods And Apparatus For Detecting Corrosion Of Conductive Objects
App 20210156789 - PENG; Gang Grant ; et al. | 2021-05-27 |
Methods And Apparatus For Dynamical Control Of Radial Uniformity With Two-story Microwave Cavities
App 20210074539 - Kobayashi; Satoru ; et al. | 2021-03-11 |
Methods And Apparatus For Dynamical Control Of Radial Uniformity In Microwave Chambers
App 20190189399 - KOBAYASHI; SATORU ; et al. | 2019-06-20 |
Semiconductor structure with multiple transistors having various threshold voltages
Grant 10,217,838 - Zhao , et al. Feb | 2019-02-26 |
Semiconductor Structure With Multiple Transistors Having Various Threshold Voltages and Method of Fabrication Thereto
App 20180261683 - Zhao; Dalong ; et al. | 2018-09-13 |
Semiconductor structure with multiple transistors having various threshold voltages
Grant 10,014,387 - Zhao , et al. July 3, 2 | 2018-07-03 |
Methods For Depositing Flowable Silicon Containing Films Using Hot Wire Chemical Vapor Deposition
App 20180148833 - CHATTERJEE; Sukti ; et al. | 2018-05-31 |
Methods For Depositing Flowable Carbon Films Using Hot Wire Chemical Vapor Deposition
App 20180148832 - CHATTERJEE; Sukti ; et al. | 2018-05-31 |
Semiconductor structure with multiple transistors having various threshold voltages
Grant 9,812,550 - Zhao , et al. November 7, 2 | 2017-11-07 |
Reducing or eliminating pre-amorphization in transistor manufacture
Grant 9,793,172 - Scudder , et al. October 17, 2 | 2017-10-17 |
Semiconductor Structure with Multiple Transistors Having Various Threshold Voltages
App 20170141209 - Zhao; Dalong ; et al. | 2017-05-18 |
Reducing or Eliminating Pre-Amorphization in Transistor Manufacture
App 20170040225 - Scudder; Lance ; et al. | 2017-02-09 |
CMOS Structures and Processes Based on Selective Thinning
App 20160307907 - Thompson; Scott E. ; et al. | 2016-10-20 |
CMOS structures and processes based on selective thinning
Grant 9,391,076 - Thompson , et al. July 12, 2 | 2016-07-12 |
Semiconductor Structure with Multiple Transistors Having Various Threshold Voltages
App 20160163823 - Zhao; Dalong ; et al. | 2016-06-09 |
Semiconductor structure with multiple transistors having various threshold voltages
Grant 9,299,698 - Zhao , et al. March 29, 2 | 2016-03-29 |
Advanced Transistors With Threshold Voltage Set Dopant Structures
App 20150340460 - Shifren; Lucian ; et al. | 2015-11-26 |
Semiconductor devices with dopant migration suppression and method of fabrication thereof
Grant 9,112,057 - Pradhan , et al. August 18, 2 | 2015-08-18 |
Semiconductor structure with reduced junction leakage and method of fabrication thereof
Grant 9,105,711 - Wang , et al. August 11, 2 | 2015-08-11 |
Deeply depleted MOS transistors having a screening layer and methods thereof
Grant 9,041,126 - Hoffmann , et al. May 26, 2 | 2015-05-26 |
Semiconductor structure with substitutional boron and method for fabrication thereof
Grant 8,999,861 - Scudder , et al. April 7, 2 | 2015-04-07 |
Process for manufacture of integrated circuits with different channel doping transistor architectures and devices therefrom
Grant 8,877,619 - Thompson , et al. November 4, 2 | 2014-11-04 |
Monitoring and measurement of thin film layers
Grant 8,796,048 - Thompson , et al. August 5, 2 | 2014-08-05 |
Method for substrate preservation during transistor fabrication
Grant 8,778,786 - Scudder , et al. July 15, 2 | 2014-07-15 |
Semiconductor Structure With Reduced Junction Leakage And Method Of Fabrication Thereof
App 20140103406 - Wang; Lingquan ; et al. | 2014-04-17 |
Deeply Depleted Mos Transistors Having A Screening Layer And Methods Thereof
App 20140084385 - Hoffmann; Thomas ; et al. | 2014-03-27 |
Semiconductor structure with reduced junction leakage and method of fabrication thereof
Grant 8,637,955 - Wang , et al. January 28, 2 | 2014-01-28 |
Semiconductor Structure With Multiple Transistors Having Various Threshold Voltages And Method Of Fabrication Thereof
App 20140001571 - Zhao; Dalong ; et al. | 2014-01-02 |
CMOS structures and processes based on selective thinning
Grant 8,614,128 - Thompson , et al. December 24, 2 | 2013-12-24 |
Reducing or eliminating pre-amorphization in transistor manufacture
Grant 8,569,156 - Scudder , et al. October 29, 2 | 2013-10-29 |
Advanced Transistors with Threshold Voltage Set Dopant Structures
App 20110079861 - Shifren; Lucian ; et al. | 2011-04-07 |
Susceptor with raised tabs for semiconductor wafer processing
App 20050016466 - Scudder, Lance ; et al. | 2005-01-27 |
Apparatus and method for surface finishing a silicon film
Grant 6,774,040 - Comita , et al. August 10, 2 | 2004-08-10 |
Apparatus and method for surface finishing a silicon film
App 20040053515 - Comita, Paul B. ; et al. | 2004-03-18 |
Apparatus and method for surface finishing a silicon film
Grant 6,562,720 - Thilderkvist , et al. May 13, 2 | 2003-05-13 |
Apparatus and method for surface finishing a silicon film
Grant 6,489,241 - Thilderkvist , et al. December 3, 2 | 2002-12-03 |
Apparatus and method for surface finishing a silicon film
App 20020090818 - Thilderkvist, Anna Lena ; et al. | 2002-07-11 |
Process for inhibiting slip and microcracking while forming epitaxial layer on semiconductor wafer
Grant 5,198,071 - Scudder , et al. March 30, 1 | 1993-03-30 |
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