Scipioni; Lawrence
Patent Applications and Registrations
Patent applications and USPTO patent grants for Scipioni; Lawrence.The latest application filed is for "magnetically enhanced, inductively coupled plasma source for a focused ion beam system".
- Scipioni; Lawrence - Bedford MA
- Scipioni; Lawrence - Beaverton OR US
- Scipioni; Lawrence - Danvers MA
| Patent | Date |
|---|---|
| Plasma source for a focused ion beam system Grant 9,640,367 - Keller , et al. May 2, 2 | 2017-05-02 |
| Magnetically Enhanced, Inductively coupled Plasma Source For a Focused Ion Beam System App 20150130348 - Keller; John ; et al. | 2015-05-14 |
| Reducing particle implantation Grant 8,907,277 - Knippelmeyer , et al. December 9, 2 | 2014-12-09 |
| Magnetically enhanced, inductively coupled plasma source for a focused ion beam system Grant 8,829,468 - Keller , et al. September 9, 2 | 2014-09-09 |
| Gas field ion microscopes having multiple operation modes Grant 8,455,840 - Scipioni June 4, 2 | 2013-06-04 |
| Dual beam system Grant 8,399,864 - Hill , et al. March 19, 2 | 2013-03-19 |
| Cross-section systems and methods Grant 8,384,029 - Knippelmeyer , et al. February 26, 2 | 2013-02-26 |
| Magnetically Enhanced, Inductively Coupled Plasma Source For A Focused Ion Beam System App 20120319000 - Keller; John ; et al. | 2012-12-20 |
| Repairing defects Grant 8,334,701 - Knippelmeyer , et al. December 18, 2 | 2012-12-18 |
| Magnetically enhanced, inductively coupled plasma source for a focused ion beam system Grant 8,168,957 - Keller , et al. May 1, 2 | 2012-05-01 |
| Cross-section Systems And Methods App 20120085906 - Knippelmeyer; Rainer ; et al. | 2012-04-12 |
| Gas Field Ion Microscopes Having Multiple Operation Modes App 20120068067 - Scipioni; Lawrence | 2012-03-22 |
| Dual Beam System App 20110309263 - Hill; Raymond ; et al. | 2011-12-22 |
| Dual beam system Grant 8,013,311 - Hill , et al. September 6, 2 | 2011-09-06 |
| Sample decontamination Grant 8,013,300 - Stern , et al. September 6, 2 | 2011-09-06 |
| Multibeam System App 20110163068 - Utlaut; Mark ; et al. | 2011-07-07 |
| Reducing Particle Implantation App 20110049364 - Knippelmeyer; Rainer ; et al. | 2011-03-03 |
| Magnetically Enhanced, Inductively Coupled Plasma Source for a Focused Ion Beam System App 20100294648 - Keller; John ; et al. | 2010-11-25 |
| Ice Layers In Charged Particle Systems And Methods App 20100136255 - Notte, IV; John A. ; et al. | 2010-06-03 |
| Repairing Defects App 20100052697 - Knippelmeyer; Rainer ; et al. | 2010-03-04 |
| Magnetically enhanced, inductively coupled plasma source for a focused ion beam system Grant 7,670,455 - Keller , et al. March 2, 2 | 2010-03-02 |
| Dual Beam System App 20100025578 - Hill; Raymond ; et al. | 2010-02-04 |
| Sample Decontamination App 20090314939 - Stern; Lewis A. ; et al. | 2009-12-24 |
| Dual beam system Grant 7,601,976 - Hill , et al. October 13, 2 | 2009-10-13 |
| Method of fabricating nanodevices Grant 7,544,523 - Schwind , et al. June 9, 2 | 2009-06-09 |
| Dual beam system App 20080035860 - Hill; Raymond ; et al. | 2008-02-14 |
| Magnetically enhanced, inductively coupled plasma source for a focused ion beam system App 20080017319 - Keller; John ; et al. | 2008-01-24 |
| Magnetically enhanced, inductively coupled plasma source for a focused ion beam system Grant 7,241,361 - Keller , et al. July 10, 2 | 2007-07-10 |
| Method of fabricating nanodevices App 20070148991 - Schwind; Gregory ; et al. | 2007-06-28 |
| Dual beam system Grant 7,161,159 - Hill , et al. January 9, 2 | 2007-01-09 |
| Fabrication of three dimensional structures Grant 7,160,475 - Scipioni January 9, 2 | 2007-01-09 |
| Magnetically enhanced, inductively coupled plasma source for a focused ion beam system App 20050183667 - Keller, John ; et al. | 2005-08-25 |
| Dual beam system App 20050035291 - Hill, Raymond ; et al. | 2005-02-17 |
| System for imaging a cross-section of a substrate Grant 6,838,668 - Berger , et al. January 4, 2 | 2005-01-04 |
| Fabrication of three dimensional structures App 20040099636 - Scipioni, Lawrence | 2004-05-27 |
| System for imaging a cross-section of a substrate Grant 6,727,500 - Berger , et al. April 27, 2 | 2004-04-27 |
| System for imaging a cross-section of a substrate App 20040065826 - Berger, Steve ; et al. | 2004-04-08 |
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