Schwindt; Randy J.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Schwindt; Randy J..The latest application filed is for "wafer probe station having a skirting component".
- Schwindt; Randy J. - Portland OR
- Schwindt; Randy J. - New Milford CT
| Patent | Date |
|---|---|
| Wafer probe station having a skirting component Grant 7,589,518 - Schwindt , et al. September 15, 2 | 2009-09-15 |
| Wafer probe station having a skirting component Grant 7,492,147 - Schwindt , et al. February 17, 2 | 2009-02-17 |
| Wafer probe station having a skirting component Grant 7,330,023 - Schwindt , et al. February 12, 2 | 2008-02-12 |
| Wafer probe station having a skirting component App 20070290700 - Schwindt; Randy J. ; et al. | 2007-12-20 |
| Low-current probe card App 20060202708 - Schwindt; Randy J. | 2006-09-14 |
| Low-current probe card Grant 7,071,718 - Schwindt July 4, 2 | 2006-07-04 |
| Low-current probe card Grant 6,995,579 - Schwindt February 7, 2 | 2006-02-07 |
| Wafer probe station for low-current measurements Grant 6,980,012 - Schwindt , et al. December 27, 2 | 2005-12-27 |
| Low-current probe card App 20050231226 - Schwindt, Randy J. | 2005-10-20 |
| Wafer probe station having a skirting component App 20050194983 - Schwindt, Randy J. ; et al. | 2005-09-08 |
| Wafer probe station having a skirting component App 20050184744 - Schwindt, Randy J. ; et al. | 2005-08-25 |
| Low-current probe card App 20040227537 - Schwindt, Randy J. | 2004-11-18 |
| Low-current probe card Grant 6,781,396 - Schwindt August 24, 2 | 2004-08-24 |
| Wafer probe station for low-current measurements Grant 6,720,782 - Schwindt , et al. April 13, 2 | 2004-04-13 |
| Wafer probe station for low-current measurements App 20040061514 - Schwindt, Randy J. ; et al. | 2004-04-01 |
| Low-current probe card App 20030071644 - Schwindt, Randy J. | 2003-04-17 |
| Wafer probe station for low-current measurements App 20030057979 - Schwindt, Randy J. ; et al. | 2003-03-27 |
| Wafer probe station for low-current measurements Grant 6,492,822 - Schwindt , et al. December 10, 2 | 2002-12-10 |
| Wafer probe station for low-current measurements App 20020043981 - Schwindt, Randy J. ; et al. | 2002-04-18 |
| Wafer probe station for low-current measurements Grant 6,335,628 - Schwindt , et al. January 1, 2 | 2002-01-01 |
| Low-current probe card App 20010011902 - Schwindt, Randy J. | 2001-08-09 |
| Wafer probe station for low-current measurements App 20010009377 - Schwindt, Randy J. ; et al. | 2001-07-26 |
| Low-current probe card Grant 6,249,133 - Schwindt June 19, 2 | 2001-06-19 |
| Wafer probe station for low-current measurements Grant 6,232,788 - Schwindt , et al. May 15, 2 | 2001-05-15 |
| Low-current probe card with reduced triboelectric current generating cables Grant 6,137,302 - Schwindt October 24, 2 | 2000-10-24 |
| Low-current probe card Grant 6,075,376 - Schwindt June 13, 2 | 2000-06-13 |
| Probe station for low current, low voltage parametric measurements using multiple probes Grant 6,031,383 - Streib , et al. February 29, 2 | 2000-02-29 |
| Low-current probe card with reduced triboelectric current generating cables Grant 5,729,150 - Schwindt March 17, 1 | 1998-03-17 |
| Wafer probe station for low-current measurements Grant 5,663,653 - Schwindt , et al. September 2, 1 | 1997-09-02 |
| Wafer probe station having full guarding Grant 5,457,398 - Schwindt , et al. October 10, 1 | 1995-10-10 |
| Wafer probe station having integrated guarding, Kelvin connection and shielding systems Grant 5,434,512 - Schwindt , et al. July 18, 1 | 1995-07-18 |
| Wafer probe station having integrated guarding, Kelvin connection and shielding systems Grant 5,345,170 - Schwindt , et al. September 6, 1 | 1994-09-06 |
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