Schwartz; Andrew R.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Schwartz; Andrew R..The latest application filed is for "method and system for measurement of sidewall damage in etched dielectric structures using a near field microwave probe".

Company Profile

0.7.7

Schwartz; Andrew R. - Bethesda MD

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method and system for measurement of sidewall damage in etched dielectric structures using a near field microwave probe Grant 7,362,108 - Talanov , et al. April 22, 2	2008-04-22
Method and system for measurement of dielectric constant of thin films using a near field microwave probe Grant 7,285,963 - Talanov , et al. October 23, 2	2007-10-23
Method and system for non-contact measurement of microwave capacitance of miniature structures of integrated circuits Grant 7,102,363 - Talanov , et al. September 5, 2	2006-09-05
Method and system for measurement of sidewall damage in etched dielectric structures using a near field microwave probe App 20060087305 - Talanov; Vladimir V. ; et al.	2006-04-27
Apertured probes for localized measurements of a material's complex permittivity and fabrication method Grant 6,959,481 - Moreland , et al. November 1, 2	2005-11-01
Method and system for measurement of dielectric constant of thin films using a near field microwave probe App 20050230619 - Talanov, Vladimir V. ; et al.	2005-10-20
Method and system for non-contact measurement of microwave capacitance of miniature structures of integrated circuits App 20050225333 - Talanov, Vladimir V. ; et al.	2005-10-13
Method and system for non-contact measurement of microwave capacitance of miniature structures of integrated circuits Grant 6,943,562 - Talanov , et al. September 13, 2	2005-09-13
System and method for quantitative measurements of a material's complex permittivity with use of near-field microwave probes Grant 6,856,140 - Talanov , et al. February 15, 2	2005-02-15
Method and system for non-contact measurement of microwave capacitance of miniature structures of integrated circuits App 20040100279 - Talanov, Vladimir V. ; et al.	2004-05-27
Apertured probes for localized measurements of a material's complex permittivity and fabrication method Grant 6,680,617 - Moreland , et al. January 20, 2	2004-01-20
System and method for quantitative measurements of a material's complex permittivity with use of near-field microwave probes App 20040004484 - Talanov, Vladimir V. ; et al.	2004-01-08
Apertured probes for localized measurements of a material's complex permittivity and fabrication method App 20030155934 - Moreland, Robert L. ; et al.	2003-08-21
Apertured probes for localized measurements of a material's complex permittivity and fabrication method App 20030030449 - Moreland, Robert L. ; et al.	2003-02-13

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