Schueler; Bruno W.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Schueler; Bruno W..The latest application filed is for "systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry".

Company Profile

9.17.17

Schueler; Bruno W. - San Jose CA
SCHUELER; Bruno W - San Jose CA
Schueler; Bruno W. - Redwood City CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Systems and approaches for semiconductor metrology and surface analysis using Secondary Ion Mass Spectrometry Grant 11,430,647 - Reed , et al. August 30, 2	2022-08-30
Systems And Approaches For Semiconductor Metrology And Surface Analysis Using Secondary Ion Mass Spectrometry App 20210305037 - REED; David A. ; et al.	2021-09-30
Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry Grant 10,910,208 - Reed , et al. February 2, 2	2021-02-02
Methods and systems for measuring periodic structures using multi-angle x-ray reflectance scatterometry (XRS) Grant 10,859,519 - Pois , et al. December 8, 2	2020-12-08
Systems And Approaches For Semiconductor Metrology And Surface Analysis Using Secondary Ion Mass Spectrometry App 20200258733 - A1	2020-08-13
Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry Grant 10,636,644 - Reed , et al.	2020-04-28
Methods And Systems For Measuring Periodic Structures Using Multi-angle X-ray Reflectance Scatterometry (xrs) App 20200088656 - Pois; Heath A. ; et al.	2020-03-19
Systems And Approaches For Semiconductor Metrology And Surface Analysis Using Secondary Ion Mass Spectrometry App 20190385831 - REED; David A. ; et al.	2019-12-19
Methods and systems for measuring periodic structures using multi-angle X-ray reflectance scatterometry (XRS) Grant 10,481,112 - Pois , et al. Nov	2019-11-19
Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry Grant 10,403,489 - Reed , et al. Sep	2019-09-03
Methods And Systems For Measuring Periodic Structures Using Multi-angle X-ray Reflectance Scatterometry (xrs) App 20190086342 - Pois; Heath A. ; et al.	2019-03-21
Systems And Approaches For Semiconductor Metrology And Surface Analysis Using Secondary Ion Mass Spectrometry App 20180330935 - REED; David A. ; et al.	2018-11-15
Methods and systems for measuring periodic structures using multi-angle X-ray reflectance scatterometry (XRS) Grant 10,119,925 - Pois , et al. November 6, 2	2018-11-06
Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry Grant 10,056,242 - Reed , et al. August 21, 2	2018-08-21
Systems And Approaches For Semiconductor Metrology And Surface Analysis Using Secondary Ion Mass Spectrometry App 20180025897 - REED; David A. ; et al.	2018-01-25
Methods And Systems For Measuring Periodic Structures Using Multi-angle X-ray Reflectance Scatterometry (xrs) App 20170176354 - Pois; Heath A. ; et al.	2017-06-22
Methods and systems for measuring periodic structures using multi-angle X-ray reflectance scatterometry (XRS) Grant 9,588,066 - Pois , et al. March 7, 2	2017-03-07
Methods and systems for fabricating platelets of a monochromator for X-ray photoelectron spectroscopy Grant 9,297,771 - Fanton , et al. March 29, 2	2016-03-29
System and method for characterizing a film by X-ray photoelectron and low-energy X-ray fluorescence spectroscopy Grant 9,240,254 - Schueler , et al. January 19, 2	2016-01-19
Methods And Systems For Measuring Periodic Structures Using Multi-angle X-ray Reflectance Scatterometry (xrs) App 20150204802 - Pois; Heath A. ; et al.	2015-07-23
Methods and Systems for Fabricating Platelets of a Monochromator for X-ray Photoelectron Spectroscopy App 20150052723 - Fanton; Jeffrey T. ; et al.	2015-02-26
System And Method For Characterizing A Film By X-ray Photoelectron And Low-energy X-ray Fluorescence Spectroscopy App 20130077742 - Schueler; Bruno W. ; et al.	2013-03-28
Method and system for calibrating an X-ray photoelectron spectroscopy measurement Grant 8,011,830 - Schueler , et al. September 6, 2	2011-09-06
Method And System For Calibrating An X-ray Photoelectron Spectroscopy Measurement App 20090268877 - Schueler; Bruno W. ; et al.	2009-10-29
Photoelectron spectroscopy apparatus and method of use Grant 7,399,963 - Schueler , et al. July 15, 2	2008-07-15
Photoelectron spectroscopy apparatus and method of use App 20070069125 - Schueler; Bruno W. ; et al.	2007-03-29
Particle analyzer apparatus and method Grant 5,128,543 - Reed , et al. July 7, 1	1992-07-07

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.