Schueler; Bruno

Patent Applications and Registrations

Patent applications and USPTO patent grants for Schueler; Bruno.The latest application filed is for "method and system for non-destructive distribution profiling of an element in a film".

Company Profile

0.10.10

Schueler; Bruno - San Jose CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method and system for non-destructive distribution profiling of an element in a film Grant 9,201,030 - deCecco , et al. December 1, 2	2015-12-01
Method And System For Non-destructive Distribution Profiling Of An Element In A Film App 20150069230 - deCecco; Paola ; et al.	2015-03-12
Method and system for non-destructive distribution profiling of an element in a film Grant 8,916,823 - deCecco , et al. December 23, 2	2014-12-23
Method And System For Non-destructive Distribution Profiling Of An Element In A Film App 20140070096 - deCecco; Paolo ; et al.	2014-03-13
Method and system for non-destructive distribution profiling of an element in a film Grant 8,610,059 - deCecco , et al. December 17, 2	2013-12-17
Method And System For Non-destructive Distribution Profiling Of An Element In A Film App 20120318974 - deCecco; Paola ; et al.	2012-12-20
Method and system for non-destructive distribution profiling of an element in a film Grant 8,269,167 - deCecco , et al. September 18, 2	2012-09-18
Method And System For Non-destructive Distribution Profiling Of An Element In A Film App 20110144787 - deCecco; Paola ; et al.	2011-06-16
Method and system for non-destructive distribution profiling of an element in a film Grant 7,884,321 - deCecco , et al. February 8, 2	2011-02-08
Method and system for non-destructive distribution profiling of an element in a film App 20080283743 - deCecco; Paola ; et al.	2008-11-20
Determining layer thickness using photoelectron spectroscopy Grant 7,420,163 - Schueler September 2, 2	2008-09-02
Method and system for non-destructive distribution profiling of an element in a film Grant 7,411,188 - deCecco , et al. August 12, 2	2008-08-12
Techniques for analyzing data generated by instruments Grant 7,231,324 - Orrock , et al. June 12, 2	2007-06-12
Method and system for non-destructive distribution profiling of an element in a film App 20070010973 - deCecco; Paola ; et al.	2007-01-11
Determining layer thickness using photoelectron spectroscopy App 20060243904 - Schueler; Bruno	2006-11-02
Techniques for analyzing data generated by instruments App 20060247899 - Orrock; James ; et al.	2006-11-02

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