Schrijen; Geert J.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Schrijen; Geert J..The latest application filed is for "method of reducing the occurrence of burn-in due to negative bias temperature instability".
- Schrijen; Geert J. - Eindhoven N/A NL
| Patent | Date |
|---|---|
| Semiconductor device identifier generation method and semiconductor device Grant 9,129,671 - Salters , et al. September 8, 2 | 2015-09-08 |
| Method of reducing the occurrence of burn-in due to negative bias temperature instability Grant 8,339,875 - Tuyls , et al. December 25, 2 | 2012-12-25 |
| Method Of Reducing The Occurrence Of Burn-in Due To Negative Bias Temperature Instability App 20110103161 - Tuyls; Pim T. ; et al. | 2011-05-05 |
| Semiconductor Device Identifier Generation Method And Semiconductor Device App 20100070777 - SALTERS; ROELOF H. W. ; et al. | 2010-03-18 |
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