loadpatents
name:-0.056357145309448
name:-0.020654201507568
name:-0.0041699409484863
Schoepp; Alan Patent Filings

Schoepp; Alan

Patent Applications and Registrations

Patent applications and USPTO patent grants for Schoepp; Alan.The latest application filed is for "compact high density plasma source".

Company Profile
0.11.12
  • Schoepp; Alan - Ben Lomond CA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Compact High Density Plasma Source
App 20210183619 - Patrick; Roger ;   et al.
2021-06-17
Deposition apparatus including an isothermal processing zone
Grant 10,808,317 - Chandrasekharan , et al. October 20, 2
2020-10-20
Controlled ambient system for interface engineering
Grant 9,117,860 - Boyd , et al. August 25, 2
2015-08-25
Method for distributing gas for a bevel etcher
Grant 8,940,098 - Sexton , et al. January 27, 2
2015-01-27
Deposition Apparatus Including An Isothermal Processing Zone
App 20150011096 - Chandrasekharan; Ramesh ;   et al.
2015-01-08
Method and System for Distributing Gas for A Bevel Edge Etcher
App 20130276821 - Sexton; Greg ;   et al.
2013-10-24
Apparatuses and methods for cleaning a substrate
Grant 7,625,452 - de Larios , et al. December 1, 2
2009-12-01
System, method and apparatus for in-situ substrate inspection
Grant 7,542,134 - Owczarz , et al. June 2, 2
2009-06-02
Apparatuses And Methods For Cleaning A Substrate
App 20090000044 - de Larios; John M. ;   et al.
2009-01-01
System, Method And Apparatus For In-situ Substrate Inspection
App 20080273195 - Owczarz; Aleksander ;   et al.
2008-11-06
Apparatuses and methods for cleaning a substrate
Grant 7,441,299 - de Larios , et al. October 28, 2
2008-10-28
Method And System For Distributing Gas For A Bevel Edge Etcher
App 20080216864 - Sexton; Greg ;   et al.
2008-09-11
System, method and apparatus for in-situ substrate inspection
Grant 7,397,555 - Owczarz , et al. July 8, 2
2008-07-08
Controlled ambient system for interface engineering
App 20080057221 - Boyd; John ;   et al.
2008-03-06
Method For Gap Fill In Controlled Ambient System
App 20080057182 - Boyd; John ;   et al.
2008-03-06
System, method and apparatus for in-situ substrate inspection
App 20060139450 - Owczarz; Aleksander ;   et al.
2006-06-29
Apparatuses and methods for cleaning a substrate
App 20050133061 - de Larios, John M. ;   et al.
2005-06-23
High temperature electrostatic chuck
Grant 6,669,783 - Sexton , et al. December 30, 2
2003-12-30
High temperature electrostatic chuck
Grant 6,567,258 - Sexton , et al. May 20, 2
2003-05-20
High temperature electrostatic chuck
App 20030003749 - Sexton, Greg ;   et al.
2003-01-02
High temperature electrostatic chuck
App 20020075625 - Sexton, Greg ;   et al.
2002-06-20
High temperature electrostatic chuck
Grant 6,377,437 - Sexton , et al. April 23, 2
2002-04-23

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