Schleifer; Elad
Patent Applications and Registrations
Patent applications and USPTO patent grants for Schleifer; Elad.The latest application filed is for "time-domain optical metrology and inspection of semiconductor devices".
- Schleifer; Elad - Rehovot IL
| Patent | Date |
|---|---|
| Accurate Raman spectroscopy Grant 11,415,519 - Hollander , et al. August 16, 2 | 2022-08-16 |
| Time-domain optical metrology and inspection of semiconductor devices Grant 11,366,398 - Barak , et al. June 21, 2 | 2022-06-21 |
| Time-domain Optical Metrology And Inspection Of Semiconductor Devices App 20210247699 - BARAK; GILAD ; et al. | 2021-08-12 |
| Accurate Raman Spectroscopy App 20210223179 - Hollander; Eyal ; et al. | 2021-07-22 |
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