Schittenhelm; Michael

Patent Applications and Registrations

Patent applications and USPTO patent grants for Schittenhelm; Michael.The latest application filed is for "system and method for testing semiconductor devices".

Company Profile

0.15.18

Schittenhelm; Michael - Poing DE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
System And Method For Testing Semiconductor Devices App 20090085596 - Ruf; Wolfgang ; et al.	2009-04-02
Circuit arrangement and method for driving electronic chips Grant 7,426,669 - Flach , et al. September 16, 2	2008-09-16
Semiconductor device test method and device App 20070132475 - Carneiro Leao; Ana Maria Sa ; et al.	2007-06-14
Test circuit for testing a synchronous memory circuit Grant 7,117,404 - Ernst , et al. October 3, 2	2006-10-03
Method and device for generating digital signal patterns Grant 7,117,403 - Ernst , et al. October 3, 2	2006-10-03
System for testing fast synchronous digital circuits, particularly semiconductor memory chips Grant 7,062,690 - Ernst , et al. June 13, 2	2006-06-13
Address generator for generating addresses for testing a circuit Grant 6,957,373 - Ernst , et al. October 18, 2	2005-10-18
Circuit arrangement and method for driving electronic chips App 20050138491 - Flach, Bjorn ; et al.	2005-06-23
Method for testing wafers to be tested and calibration apparatus Grant 6,897,646 - Grebner , et al. May 24, 2	2005-05-24
Method and device for reading and for checking the time position of data response signals read out from a memory module to be tested Grant 6,871,306 - Ernst , et al. March 22, 2	2005-03-22
Test data generator Grant 6,865,707 - Ernst , et al. March 8, 2	2005-03-08
Address counter for addressing synchronous high-frequency digital circuits, in particular memory devices Grant 6,862,702 - Ernst , et al. March 1, 2	2005-03-01
Circuit configuration for generating control signals for testing high-frequency synchronous digital circuits Grant 6,839,397 - Ernst , et al. January 4, 2	2005-01-04
Test circuit Grant 6,744,272 - Ernst , et al. June 1, 2	2004-06-01
Method of calibrating a test system for semiconductor components, and test substrate Grant 6,724,181 - Schittenhelm April 20, 2	2004-04-20
System for testing fast integrated digital circuits, in particular semiconductor memory modules Grant 6,721,904 - Ernst , et al. April 13, 2	2004-04-13
Test circuit for testing a circuit Grant 6,618,305 - Ernst , et al. September 9, 2	2003-09-09
System for testing fast synchronous semiconductor circuits Grant 6,556,492 - Ernst , et al. April 29, 2	2003-04-29
Method for testing wafers to be tested and calibration apparatus App 20030076126 - Grebner, Thomas ; et al.	2003-04-24
Test circuit for testing a synchronous memory circuit App 20030005361 - Ernst, Wolfgang ; et al.	2003-01-02
Test circuit for testing a synchronous circuit App 20030005389 - Ernst, Wolfgang ; et al.	2003-01-02
Test circuit for testing a circuit App 20020196688 - Ernst, Wolfgang ; et al.	2002-12-26
Test circuit App 20020171447 - Ernst, Wolfgang ; et al.	2002-11-21
Method and device for reading and for checking the time position of data response signals read out from a memory module to be tested App 20020160558 - Ernst, Wolfgang ; et al.	2002-10-31
Test data generator App 20020157052 - Ernst, Wolfgang ; et al.	2002-10-24
Method of calibrating a test system for semiconductor components, and test substrate App 20020075030 - Schittenhelm, Michael	2002-06-20
System for testing fast synchronous digital circuits, particularly semiconductor memory chips App 20020070748 - Ernst, Wolfgang ; et al.	2002-06-13
Field-effect-controlled transistor and method for fabricating the transistor App 20020014669 - Widmann, Dietrich ; et al.	2002-02-07
Address counter for addressing synchronous high-frequency digital circuits, in particular memory devices App 20020012286 - Ernst, Wolfgang ; et al.	2002-01-31
System for testing fast synchronous semiconductor circuits App 20020012283 - Ernst, Wolfgang ; et al.	2002-01-31
Method and device for generating digital signal patterns App 20020009007 - Ernst, Wolfgang ; et al.	2002-01-24
System for testing fast integrated digital circuits, in particular semiconductor memory modules App 20020010877 - Ernst, Wolfgang ; et al.	2002-01-24
Circuit configuration for generating control signals for testing high-frequency synchronous digital circuits App 20020010878 - Ernst, Wolfgang ; et al.	2002-01-24

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