loadpatents
name:-0.01459813117981
name:-0.011188983917236
name:-0.0023469924926758
Schellhorn; Uwe Patent Filings

Schellhorn; Uwe

Patent Applications and Registrations

Patent applications and USPTO patent grants for Schellhorn; Uwe.The latest application filed is for "device and method for the optical measurement of an optical system by using an immersion fluid".

Company Profile
0.11.11
  • Schellhorn; Uwe - Aalen DE
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Beam control apparatus for an illumination beam and metrology system comprising an optical system containing such a beam control apparatus
Grant 8,988,752 - Krebs , et al. March 24, 2
2015-03-24
Device And Method For The Optical Measurement Of An Optical System By Using An Immersion Fluid
App 20140022524 - Wegmann; Ulrich ;   et al.
2014-01-23
Method for calibrating a specimen stage of a metrology system and metrology system comprising a specimen stage
Grant 8,473,237 - Huebel , et al. June 25, 2
2013-06-25
Beam Control Apparatus For An Illumination Beam And Metrology System Comprising An Optical System Containing Such A Beam Control Apparatus
App 20130120820 - Krebs; Marten ;   et al.
2013-05-16
Method for determination of residual errors
Grant 8,416,412 - Schellhorn , et al. April 9, 2
2013-04-09
Device And Method For The Optical Measurement Of An Optical System By Using An Immersion Fluid
App 20120113429 - Wegmann; Ulrich ;   et al.
2012-05-10
Device and method for the optical measurement of an optical system by using an immersion fluid
Grant 8,120,763 - Wegmann , et al. February 21, 2
2012-02-21
Method For Calibrating A Specimen Stage Of A Metrology System And Metrology System Comprising A Specimen Stage
App 20100241384 - Huebel; Alexander ;   et al.
2010-09-23
Apparatus And Method For Measuring The Positions Of Marks On A Mask
App 20100153059 - Klose; Gerd ;   et al.
2010-06-17
Method For Determination Of Residual Errors
App 20100097608 - Schellhorn; Uwe ;   et al.
2010-04-22
Device And Method For The Optical Measurement Of An Optical System By Using An Immersion Fluid
App 20090257049 - Wegmann; Ulrich ;   et al.
2009-10-15
Device And Method For The Optical Measurement Of An Optical System By Using An Immersion Fluid
App 20090021726 - Wegmann; Ulrich ;   et al.
2009-01-22
Device and method for the optical measurement of an optical system by using an immersion fluid
Grant 7,408,652 - Wegmann , et al. August 5, 2
2008-08-05
Method for determining distortion and/or image surface
Grant 7,400,388 - Emer , et al. July 15, 2
2008-07-15
Phase shifting wavefront interference method
Grant 7,119,910 - Schellhorn October 10, 2
2006-10-10
Moire method and measuring system for measuring the distortion of an optical imaging system
Grant 7,019,824 - Wegmann , et al. March 28, 2
2006-03-28
Method for determining distortion and/or image surface
App 20060007429 - Emer; Wolfgang ;   et al.
2006-01-12
Device and method for the optical measurement of an optical system, a container therefor, and a microlithography projection exposure machine
App 20050243328 - Wegmann, Ulrich ;   et al.
2005-11-03
Moire method and measuring system for measuring the distortion of an optical imaging system
App 20050122506 - Wegmann, Ulrich ;   et al.
2005-06-09
Moire method and a system for measuring the distortion of an optical imaging system
Grant 6,816,247 - Heppner , et al. November 9, 2
2004-11-09

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed