loadpatents
name:-0.0091278553009033
name:-0.0082440376281738
name:-0.00072312355041504
Scheinfein; Michael R. Patent Filings

Scheinfein; Michael R.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Scheinfein; Michael R..The latest application filed is for "microcalorimetry for x-ray spectroscopy".

Company Profile
0.7.6
  • Scheinfein; Michael R. - Portland OR US
  • Scheinfein; Michael R. - West Vancouver CA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Microcalorimetry for X-ray spectroscopy
Grant 8,357,894 - Toth , et al. January 22, 2
2013-01-22
Microcalorimetry For X-ray Spectroscopy
App 20110064191 - Toth; Milos ;   et al.
2011-03-17
Device and method for milling of material using ions
Grant 7,504,623 - Fischione , et al. March 17, 2
2009-03-17
Electron beam source having an extraction electrode provided with a magnetic disk element
Grant 7,372,195 - Coyle , et al. May 13, 2
2008-05-13
Electron beam source for use in electron gun
App 20070057617 - Coyle; Steven T. ;   et al.
2007-03-15
Device and method for milling of material using ions
App 20070023701 - Fishione; Paul E. ;   et al.
2007-02-01
Device and method for milling of material using ions
Grant 7,132,673 - Fischione , et al. November 7, 2
2006-11-07
Device and method for milling of material using ions
App 20060022148 - Fischione; Paul E. ;   et al.
2006-02-02
Collection of secondary electrons through the objective lens of a scanning electron microscope
Grant 6,946,654 - Gerlach , et al. September 20, 2
2005-09-20
Focused ion beam system with coaxial scanning electron microscope
Grant 6,900,447 - Gerlach , et al. May 31, 2
2005-05-31
Focused ion beam system with coaxial scanning electron microscope
App 20040108458 - Gerlach, Robert L. ;   et al.
2004-06-10
Collection of secondary electrons through the objective lens of a scanning electron microscope
App 20020024013 - Gerlach, Robert L. ;   et al.
2002-02-28

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