Schattenburg; Mark

Patent Applications and Registrations

Patent applications and USPTO patent grants for Schattenburg; Mark.The latest application filed is for "stress patterning systems and methods for manufacturing free-form deformations in thin substrates".

Company Profile

3.6.5

Schattenburg; Mark - Framingham MA
Schattenburg; Mark - Wayland MA
Schattenburg; Mark - Needham MA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Stress Patterning Systems And Methods For Manufacturing Free-form Deformations In Thin Substrates App 20210047729 - Yao; Youwei ; et al.	2021-02-18
Apparatus and method for using scanning light beam for film or surface modification Grant 10,503,083 - Schattenburg , et al. Dec	2019-12-10
Apparatus And Method For Using Scanning Light Beam For Film Or Surface Modification App 20190056675 - Schattenburg; Mark ; et al.	2019-02-21
Detection of position, orientation and scale of work pieces using retroreflective surfaces Grant 10,145,672 - Schattenburg , et al. De	2018-12-04
Apparatus and method for using scanning light beam for film or surface modification Grant 10,108,096 - Schattenburg , et al. October 23, 2	2018-10-23
Detection Of Position, Orientation And Scale Of Work Pieces Using Retroreflective Surfaces App 20180209780 - Schattenburg; Mark ; et al.	2018-07-26
Apparatus And Method For Using Scanning Light Beam For Film Or Surface Modification App 20170060004 - Hendel; Rudolph ; et al.	2017-03-02
Hybrid transmission-reflection grating Grant 7,492,989 - Heilmann , et al. February 17, 2	2009-02-17
Hybrid transmission-reflection grating App 20070280595 - Heilmann; Ralf ; et al.	2007-12-06
Method and system for interference lithography utilizing phase-locked scanning beams Grant 6,882,477 - Schattenburg , et al. April 19, 2	2005-04-19
X-ray lithography masking Grant 5,809,103 - Smith , et al. September 15, 1	1998-09-15

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