| Patent | Date |
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Integrated circuit
Grant 7,808,272 - Kaiser , et al. October 5, 2 | 2010-10-05 |
Means of mounting for electronic components, arrangement and procedure
Grant 7,427,202 - Schamberger , et al. September 23, 2 | 2008-09-23 |
Semiconductor Memory Device And Method
App 20080155313 - Schamberger; Florian ; et al. | 2008-06-26 |
Storage Element And Method For Operating A Storage Element
App 20080062738 - Schamberger; Florian ; et al. | 2008-03-13 |
Method for testing semiconductor memory modules
Grant 7,296,198 - Kaiser , et al. November 13, 2 | 2007-11-13 |
Method for repairing hardware faults in memory chips
Grant 7,222,271 - Ruckerbauer , et al. May 22, 2 | 2007-05-22 |
Method for comparing the address of a memory access with an already known address of a faulty memory cell
Grant 7,181,643 - Kaiser , et al. February 20, 2 | 2007-02-20 |
Integrated circuit
App 20060265440 - Kaiser; Robert ; et al. | 2006-11-23 |
Means of mounting for electronic components, arrangement and procedure
App 20060170115 - Schamberger; Florian ; et al. | 2006-08-03 |
Method and circuit for adjusting a resistance in an integrated circuit
Grant 7,054,180 - Schamberger , et al. May 30, 2 | 2006-05-30 |
Integrated circuit having a data processing unit and a buffer memory
Grant 7,047,454 - Kaiser , et al. May 16, 2 | 2006-05-16 |
Method and circuit for adjusting a resistance in an integrated circuit
App 20050196909 - Schamberger, Florian ; et al. | 2005-09-08 |
Method for producing an antifuse in a substrate and an antifuse structure for integration in a substrate
Grant 6,919,234 - Lindolf , et al. July 19, 2 | 2005-07-19 |
Circuit configuration for driving a programmable link
Grant 6,868,028 - Kaiser , et al. March 15, 2 | 2005-03-15 |
Circuit configuration for level boosting, in particular for driving a programmable link
Grant 6,856,186 - Schamberger February 15, 2 | 2005-02-15 |
Method for producing an antifuse structure and antifuse
App 20050023637 - Lindolf, Jurgen ; et al. | 2005-02-03 |
Method for producing an antifuse in a substrate and an antifuse structure for integration in a substrate
App 20050003647 - Lindolf, Jurgen ; et al. | 2005-01-06 |
Circuit configuration for driving a programmable link
Grant 6,807,123 - Kaiser , et al. October 19, 2 | 2004-10-19 |
Method and apparatus for operating a semiconductor memory at double data transfer rate
Grant 6,804,166 - Kaiser , et al. October 12, 2 | 2004-10-12 |
Semiconductor component for connection to a test system
Grant 6,800,817 - Schneider , et al. October 5, 2 | 2004-10-05 |
Integrated circuit having a programmable element and method of operating the circuit
Grant 6,788,129 - Peter , et al. September 7, 2 | 2004-09-07 |
Method for comparing the address of a memory access with an already known address of a faulty memory cell
App 20040153843 - Kaiser, Robert ; et al. | 2004-08-05 |
Circuit configuration for driving a programmable link
Grant 6,768,695 - Kaiser , et al. July 27, 2 | 2004-07-27 |
Integrated circuit having a self-test device for carrying out a self-test of the integrated circuit
Grant 6,728,902 - Kaiser , et al. April 27, 2 | 2004-04-27 |
Method and apparatus for operating a semiconductor memory at double data transfer rate
App 20040066701 - Kaiser, Robert ; et al. | 2004-04-08 |
Semiconductor module
Grant 6,717,437 - Hemmert , et al. April 6, 2 | 2004-04-06 |
Vertical field effect transistor with internal annular gate and method of production
Grant 6,717,200 - Schamberger , et al. April 6, 2 | 2004-04-06 |
Configuration for generating signal impulses of defined lengths in a module with a bist-function
Grant 6,715,118 - Kaiser , et al. March 30, 2 | 2004-03-30 |
Circuit configuration for driving a programmable link
App 20040037128 - Kaiser, Robert ; et al. | 2004-02-26 |
Circuit configuration for driving a programmable link
App 20040032787 - Kaiser, Robert ; et al. | 2004-02-19 |
Circuit configuration for level boosting, in particular for driving a programmable link
App 20040027189 - Schamberger, Florian | 2004-02-12 |
Circuit configuration for driving a programmable link
App 20040004892 - Kaiser, Robert ; et al. | 2004-01-08 |
Integrated circuit having a self-test device
Grant 6,675,322 - Schaffroth , et al. January 6, 2 | 2004-01-06 |
Integrated circuit having a programmable element and method of operating the circuit
App 20030094996 - Peter, Jorg ; et al. | 2003-05-22 |
Method for repairing hardware faults in memory chips
App 20020188897 - Ruckerbauer, Hermann ; et al. | 2002-12-12 |
Integrated semiconductor circuit with an increased operating voltage
App 20020171469 - Kaiser, Robert ; et al. | 2002-11-21 |
Method for testing semiconductor memory modules
App 20020157049 - Kaiser, Robert ; et al. | 2002-10-24 |
Method for identifying an integrated circuit and integrated circuit
App 20020149979 - Kaiser, Robert ; et al. | 2002-10-17 |
Semiconductor module
App 20020135411 - Hemmert, Heinrich ; et al. | 2002-09-26 |
Method and memory system for writing in data
App 20020136061 - Kaiser, Robert ; et al. | 2002-09-26 |
Semiconductor component for connection to a test system
App 20020097616 - Schneider, Helmut ; et al. | 2002-07-25 |
Integrated circuit having a data processing unit and a buffer memory
App 20020083380 - Kaiser, Robert ; et al. | 2002-06-27 |
Semiconductor circuit configuration
App 20010050416 - Kaiser, Robert ; et al. | 2001-12-13 |
Method of repairing defective memory cells of an integrated memory
App 20010017806 - Schamberger, Florian ; et al. | 2001-08-30 |
Configuration for generating signal impulses of defined lengths in a module with a bist-function
App 20010018754 - Kaiser, Robert ; et al. | 2001-08-30 |
Integrated circuit having a self-test device for carrying out a self-test of the integrated circuit
App 20010011904 - Kaiser, Robert ; et al. | 2001-08-09 |
Integrated memory having a self-repair function
Grant 6,178,124 - Kaiser , et al. January 23, 2 | 2001-01-23 |
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