Scan Technology Co., Ltd.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Scan Technology Co., Ltd..The latest application filed is for "inspecting apparatus and method for foreign matter".

Company Profile

0.7.4

Scan Technology Co., Ltd. - Tokyo JP
SCAN TECHNOLOGY CO., LTD. -
Scan Technology Co., Ltd. - Warabi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Inspecting apparatus and method for foreign matter Grant 7,342,655 - Yagita March 11, 2	2008-03-11
Inspecting apparatus and method for foreign matter App 20060244959 - Yagita; Kiyoshi	2006-11-02
Inspecting apparatus for foreign matter and inspecting mechanism thereof Grant 6,914,672 - Yagita July 5, 2	2005-07-05
Inspecting method and apparatus for foreign matter Grant 6,911,653 - Yagita June 28, 2	2005-06-28
Inspecting apparatus for foreign matter Grant 6,825,925 - Yagita November 30, 2	2004-11-30
Inspecting apparatus for foreign matter App 20030214649 - Yagita, Kiyoshi	2003-11-20
Inspecting apparatus for foreign matter and inspecting mechanism thereof App 20030210397 - Yagita, Kiyoshi	2003-11-13
Inspecting method and apparatus for foreign matter App 20030201384 - Yagita, Kiyoshi	2003-10-30
Code recognition method and system for rotating body Grant 6,089,455 - Yagita July 18, 2	2000-07-18
Control method for factory automation system Grant 6,038,486 - Saitoh , et al. March 14, 2	2000-03-14
Print inspection method, print inspection apparatus and automatic print sorting system Grant 4,872,024 - Nagai , et al. October 3, 1	1989-10-03

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