Scaman; Michael E.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Scaman; Michael E..The latest application filed is for "system and method for testing pattern sensitive algorithms for semiconductor design".

Company Profile

0.13.10

Scaman; Michael E. - Goshen NY
Scaman; Michael E. - Peekskill NY

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
System and method for testing pattern sensitive algorithms for semiconductor design Grant 8,201,132 - DeMaris , et al. June 12, 2	2012-06-12
Calibration and verification structures for use in optical proximity correction Grant 8,161,421 - Viswanathan , et al. April 17, 2	2012-04-17
Ionization test for electrical verification Grant 7,808,257 - Cline , et al. October 5, 2	2010-10-05
System And Method For Testing Pattern Sensitive Algorithms For Semiconductor Design App 20100095254 - DeMaris; David L. ; et al.	2010-04-15
Testing pattern sensitive algorithms for semiconductor design Grant 7,685,544 - DeMaris , et al. March 23, 2	2010-03-23
Iterative method for refining integrated circuit layout using compass optical proximity correction (OPC) Grant 7,673,279 - Scaman March 2, 2	2010-03-02
Meef Reduction By Elongation Of Square Shapes App 20100042967 - Dunn; Derren N. ; et al.	2010-02-18
Calibration And Verificataion Structures For Use In Optical Proximity Correction App 20100005440 - Viswanathan; Ramya ; et al.	2010-01-07
Contact Level Mask Layouts By Introducing Anisotropic Sub-Resolution Assist Features App 20090191468 - Crouse; Michael M. ; et al.	2009-07-30
Iterative Method For Refining Integrated Circuit Layout Using Compass Optical Proximity Correction (opc) App 20080141203 - Scaman; Michael E.	2008-06-12
Testing Pattern Sensitive Algorithms For Semiconductor Design App 20080104555 - DeMaris; David L. ; et al.	2008-05-01
Iterative method for refining integrated circuit layout using compass optical proximity correction (OPC) Grant 7,360,199 - Scaman April 15, 2	2008-04-15
System and method for testing pattern sensitive algorithms for semiconductor design Grant 7,353,472 - DeMaris , et al. April 1, 2	2008-04-01
Iterative Method For Refining Integrated Circuit Layout Using Compass Optical Proximity Correction (opc) App 20070277145 - Scaman; Michael E.	2007-11-29
Ionization test for electrical verification App 20070108984 - Cline; Christopher W. ; et al.	2007-05-17
Wiring test structures for determining open and short circuits in semiconductor devices Grant 7,187,179 - Scaman , et al. March 6, 2	2007-03-06
System and method for testing pattern sensitive algorithms for semiconductor design App 20070038970 - DeMaris; David L. ; et al.	2007-02-15
Thermal modulation system and method for locating a circuit defect Grant 6,400,128 - Guidotti , et al. June 4, 2	2002-06-04
Thermal modulation system and method for locating a circuit defect App 20010035748 - Guidotti, Daniel ; et al.	2001-11-01
Method for detecting power plane-to-power plane shorts and I/O net-to power plane shorts in modules and printed circuit boards Grant 6,242,923 - Scaman , et al. June 5, 2	2001-06-05
Method and apparatus for locating power plane shorts using polarized light microscopy Grant 6,141,093 - Argyle , et al. October 31, 2	2000-10-31
Method and apparatus for detecting shorts in a multi-layer electronic package Grant 5,821,759 - Scaman , et al. October 13, 1	1998-10-13
Thin-film latent open optical detection with template-based feature extraction Grant 5,448,650 - Desai , et al. September 5, 1	1995-09-05

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