| Patent | Date |
|---|
Determining test conditions for at-speed transition delay fault tests on semiconductor devices
Grant 10,107,859 - Saxena , et al. October 23, 2 | 2018-10-23 |
Automatable scan partitioning for low power using external control
Grant 9,103,882 - Saxena , et al. August 11, 2 | 2015-08-11 |
Automatable Scan Partitioning For Low Power Using External Control
App 20140250342 - Saxena; Jayashree ; et al. | 2014-09-04 |
Decoder providing separate clock and enable for scan path segments
Grant 8,769,358 - Saxena , et al. July 1, 2 | 2014-07-01 |
Automatable Scan Partitioning For Low Power Using External Control
App 20130339773 - Saxena; Jayashree ; et al. | 2013-12-19 |
Decode logic driving segmented scan cells with clocks and enables
Grant 8,539,294 - Saxena , et al. September 17, 2 | 2013-09-17 |
Automatable Scan Partitioning For Low Power Using External Control
App 20130047048 - Saxena; Jayashree ; et al. | 2013-02-21 |
Divided scan path segments maintaining test pattern of stimulus/response connections
Grant 8,321,729 - Saxena , et al. November 27, 2 | 2012-11-27 |
Automatable Scan Partitioning For Low Power Using External Control
App 20110197102 - Saxena; Jayashree ; et al. | 2011-08-11 |
Automatable scan partitioning for low power using external control
Grant 7,954,030 - Saxena , et al. May 31, 2 | 2011-05-31 |
Automatable Scan Partitioning For Low Power Using External Control
App 20110078524 - Saxena; Jayashree ; et al. | 2011-03-31 |
Automatable scan partitioning for low power using external control
Grant 7,870,451 - Saxena , et al. January 11, 2 | 2011-01-11 |
System and method for estimating test escapes in integrated circuits
Grant 7,865,849 - Butler , et al. January 4, 2 | 2011-01-04 |
Automatable Scan Partitioning For Low Power Using External Control
App 20100023823 - Saxena; Jayashree ; et al. | 2010-01-28 |
Automatable scan partitioning for low power using external control
Grant 7,617,429 - Saxena , et al. November 10, 2 | 2009-11-10 |
Test protocol manager for massive multi-site test
Grant 7,580,807 - Bullock , et al. August 25, 2 | 2009-08-25 |
System And Method For Estimating Test Escapes In Integrated Circuits
App 20090210830 - Butler; Kenneth M. ; et al. | 2009-08-20 |
Timing closure for system on a chip using voltage drop based standard delay formats
Grant 7,324,914 - Jain , et al. January 29, 2 | 2008-01-29 |
Test Protocol Manager for Massive Multi-Site Test
App 20080015798 - Bullock; Matthew Craig ; et al. | 2008-01-17 |
Automatable Scan Partitioning For Low Power Using External Control
App 20070162805 - Saxena; Jayashree ; et al. | 2007-07-12 |
Decode logic selecting IC scan path parts
Grant 7,219,284 - Saxena , et al. May 15, 2 | 2007-05-15 |
Power reduction in module-based scan testing
App 20060107144 - Saxena; Jayashree ; et al. | 2006-05-18 |
Timing closure for system on a chip using voltage drop based standard delay formats
App 20060106564 - Jain; Atul K. ; et al. | 2006-05-18 |
Automatable scan partitioning for low power using external control
App 20040260990 - Saxena, Jayashree ; et al. | 2004-12-23 |
Divided scan path with decode logic receiving select control signals
Grant 6,766,487 - Saxena , et al. July 20, 2 | 2004-07-20 |
System and method for pruning a bridging diagnostic list
Grant 6,618,830 - Balachandran , et al. September 9, 2 | 2003-09-09 |
Method and apparatus for efficient burn-in of electronic circuits
App 20030149913 - Balachandran, Hari ; et al. | 2003-08-07 |
Automatable scan partitioning for low power using external control
App 20020104050 - Saxena, Jayashree ; et al. | 2002-08-01 |
| 