Sawlani; Kapil
Patent Applications and Registrations
Patent applications and USPTO patent grants for Sawlani; Kapil.The latest application filed is for "defect classification and source analysis for semiconductor equipment".
- Sawlani; Kapil - Ann Arbor MI
- Sawlani; Kapil - San Jose CA
| Patent | Date |
|---|---|
| Defect Classification And Source Analysis For Semiconductor Equipment App 20220270237 - Sawlani; Kapil ; et al. | 2022-08-25 |
| Defect classification and source analysis for semiconductor equipment Grant 11,263,737 - Sawlani , et al. March 1, 2 | 2022-03-01 |
| Fill process optimization using feature scale modeling Grant 10,977,405 - Bowes , et al. April 13, 2 | 2021-04-13 |
| In-situ chamber clean end point detection systems and methods using computer vision systems Grant 10,895,539 - Sawlani , et al. January 19, 2 | 2021-01-19 |
| Fill Process Optimization Using Feature Scale Modeling App 20200242209 - Bowes; Michael ; et al. | 2020-07-30 |
| Defect Classification And Source Analysis For Semiconductor Equipment App 20200226742 - Sawlani; Kapil ; et al. | 2020-07-16 |
| In-situ Chamber Clean End Point Detection Systems And Methods Using Computer Vision Systems App 20190120775 - Sawlani; Kapil ; et al. | 2019-04-25 |
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