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Sawara; Atsuo Patent Filings

Sawara; Atsuo

Patent Applications and Registrations

Patent applications and USPTO patent grants for Sawara; Atsuo.The latest application filed is for "test apparatus, test method, measurement apparatus and measurement method".

Company Profile
0.2.3
  • Sawara; Atsuo - Tokyo JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Test apparatus for testing a device under test and device for receiving a signal
Grant 8,145,965 - Nagatani , et al. March 27, 2
2012-03-27
Measurement apparatus and measurement method
Grant 7,808,252 - Sawara , et al. October 5, 2
2010-10-05
Test Apparatus, Test Method, Measurement Apparatus And Measurement Method
App 20090261807 - SAWARA; ATSUO ;   et al.
2009-10-22
Jitter Applying Circuit And Test Apparatus
App 20090158100 - SAWARA; ATSUO ;   et al.
2009-06-18
Test Apparatus And Device
App 20080294952 - NAGATANI; KENICHI ;   et al.
2008-11-27

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