Sawamura; Yoshimi
Patent Applications and Registrations
Patent applications and USPTO patent grants for Sawamura; Yoshimi.The latest application filed is for "optical characteristic measuring apparatus using light reflected from object to be measured and focus adjusting method therefor".
- Sawamura; Yoshimi - Kyoto-shi JP
- Sawamura; Yoshimi - Kyoto JP
| Patent | Date |
|---|---|
| Optical Characteristic Measuring Apparatus Using Light Reflected From Object To Be Measured And Focus Adjusting Method Therefor App 20080283723 - FUJIMORI; Tadayoshi ; et al. | 2008-11-20 |
| Automatic optical measurement method Grant 6,922,247 - Inamoto , et al. July 26, 2 | 2005-07-26 |
| Automatic optical measurement method App 20030147081 - Inamoto, Naoki ; et al. | 2003-08-07 |
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