Sawamura; Makoto

Patent Applications and Registrations

Patent applications and USPTO patent grants for Sawamura; Makoto.The latest application filed is for "cavity soi substrate".

Company Profile

4.11.18

Sawamura; Makoto - Nagaokakyo JP
Sawamura; Makoto - Nagaokakyo-shi JP
Sawamura; Makoto - Sakai JP
SAWAMURA; Makoto - Sakai City JP
Sawamura; Makoto - Ibaraki JP
Sawamura; Makoto - Osaka JP
Sawamura; Makoto - Sapporo JP
Sawamura; Makoto - Sapporo-shi JP
Sawamura; Makoto - US
Sawamura; Makoto - Osaka-shi JP
Sawamura; Makoto - Hokkaido JP
Sawamura, Makoto - Sapporo City JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Acoustic wave device, high-frequency front-end circuit, and communication device Grant 11,245,380 - Sawamura , et al. February 8, 2	2022-02-08
Cavity Soi Substrate App 20220002142 - Sawamura; Makoto ; et al.	2022-01-06
Acoustic Wave Device, High-frequency Front-end Circuit, And Communication Device App 20200321938 - SAWAMURA; Makoto ; et al.	2020-10-08
Acoustic Wave Device, High-frequency Front End Circuit, Communication Device, And Method For Manufacturing Acoustic Wave Device App 20200321933 - KISHIMOTO; Yutaka ; et al.	2020-10-08
Acoustic Wave Device, High-frequency Front-end Circuit, And Communication Device App 20200321937 - KISHI; Yuzo ; et al.	2020-10-08
Elastic Wave Device Manufacturing Method, Elastic Wave Device, Radio-frequency Front-end Circuit, And Communication Device App 20190312559 - SAWAMURA; Makoto ; et al.	2019-10-10
Semiconductor light-emitting device Grant 9,911,902 - Sawamura , et al. March 6, 2	2018-03-06
Semiconductor Light-emitting Device App 20170179342 - SAWAMURA; Makoto ; et al.	2017-06-22
Sensor for detecting material to be tested Grant 8,806,923 - Sawamura August 19, 2	2014-08-19
Light emitting device Grant 8,212,467 - Sawamura , et al. July 3, 2	2012-07-03
Sensor For Detecting Material To Be Tested App 20120137797 - Sawamura; Makoto	2012-06-07
Biosensor having ultra fine fiber Grant 8,072,008 - Mukasa , et al. December 6, 2	2011-12-06
Method for Sensing a Substance to be Detected in a Sample App 20110183438 - MATSUMOTO; Kazuhiko ; et al.	2011-07-28
Method for Sensing a Substance to be Detected in a Sample App 20110180427 - MATSUMOTO; Kazuhiko ; et al.	2011-07-28
Single-electron transistor, field-effect transistor, sensor, method for producing sensor, and sensing method Grant 7,935,989 - Matsumoto , et al. May 3, 2	2011-05-03
Light Emitting Device App 20110068679 - Sawamura; Makoto ; et al.	2011-03-24
Carbon Nanotube Electric Field Effect Transistor and Process for Producing the Same App 20100032653 - Takeda; Seiji ; et al.	2010-02-11
Field Effect Transistor, Biosensor Provided With It, And Detecting Method App 20080283875 - MUKASA; Koichi ; et al.	2008-11-20
Single-electron transistor, field-effect transistor, sensor, method for producing sensor, and sensing method App 20060273356 - Matsumoto; Kazuhiko ; et al.	2006-12-07
Magnetic recording element, magnetic memory, magnetic recording method, method for fabricating a magnetic recording element, and method for fabricating a magnetic memory Grant 6,757,192 - Mukasa , et al. June 29, 2	2004-06-29
Scanning magnetism detector and probe Grant 6,750,450 - Mukasa , et al. June 15, 2	2004-06-15
Probe having at least one magnetic resistive element for measuring leakage magnetic field Grant 6,717,402 - Mukasa , et al. April 6, 2	2004-04-06
Scanning probe microscope Grant 6,655,196 - Mukasa , et al. December 2, 2	2003-12-02
Scanning probe microscope App 20030010099 - Mukasa, Koichi ; et al.	2003-01-16
Magnetic recording element, magnetic memory, magnetic recording method, method for a fabricating a magnetic recording element, and method for a fabricating a magnetic memory App 20020196658 - Mukasa, Koichi ; et al.	2002-12-26
Scanning magnetism detector and probe App 20020149362 - Mukasa, Koichi ; et al.	2002-10-17
Method and apparatus for multiplying a frequency of an electromagnetic wave App 20020135443 - Watanabe, Hideki ; et al.	2002-09-26
Probe for measuring leakage magnetic field App 20020121897 - Mukasa, Koichi ; et al.	2002-09-05

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