Sawada; Hidetaka

Patent Applications and Registrations

Patent applications and USPTO patent grants for Sawada; Hidetaka.The latest application filed is for "aberration corrector and electron microscope".

Company Profile

1.24.18

Sawada; Hidetaka - Tokyo JP
Sawada; Hidetaka - Osaka JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Aberration corrector and electron microscope Grant 10,720,301 - Sawada	2020-07-21
Distortion measurement method for electron microscope image, electron microscope, distortion measurement specimen, and method of manufacturing distortion measurement specimen Grant 10,541,111 - Konyuba , et al. Ja	2020-01-21
Aberration Corrector and Electron Microscope App 20190228945 - Sawada; Hidetaka	2019-07-25
Distortion Measurement Method for Electron Microscope Image, Electron Microscope, Distortion Measurement Specimen, and Method of Manufacturing Distortion Measurement Specimen App 20180342370 - Konyuba; Yuji ; et al.	2018-11-29
Liner Tube and Electron Microscope App 20180166252 - Sawada; Hidetaka ; et al.	2018-06-14
Liner tube and electron microscope Grant 9,997,327 - Sawada , et al. June 12, 2	2018-06-12
Electron microscope and measurement method Grant 9,859,095 - Shibata , et al. January 2, 2	2018-01-02
Two-stage dodecapole aberration corrector for charged-particle beam Grant 9,793,088 - Sawada , et al. October 17, 2	2017-10-17
Electron Microscope and Measurement Method App 20170025248 - Shibata; Naoya ; et al.	2017-01-26
Multipole lens, aberration corrector, and electron microscope Grant 9,349,565 - Sawada May 24, 2	2016-05-24
Spherical aberration corrector, method of spherical aberration correction, and charged particle beam instrument Grant 9,256,068 - Sawada , et al. February 9, 2	2016-02-09
Multipole Lens, Aberration Corrector, and Electron Microscope App 20150332889 - Sawada; Hidetaka	2015-11-19
Spherical Aberration Corrector, Method of Spherical Aberration Correction, and Charged Particle Beam Instrument App 20150029593 - Sawada; Hidetaka ; et al.	2015-01-29
Method For Axial Alignment Of Charged Particle Beam And Charged Particle Beam System App 20140367585 - Sawada; Hidetaka ; et al.	2014-12-18
Method for axial alignment of charged particle beam and charged particle beam system Grant 8,907,298 - Sawada , et al. December 9, 2	2014-12-09
Method for axial alignment of charged particle beam and charged particle beam system Grant 8,847,172 - Sawada , et al. September 30, 2	2014-09-30
Chromatic aberration corrector and electron microscope Grant 8,785,880 - Sawada , et al. July 22, 2	2014-07-22
Chromatic Aberration Corrector And Electron Microscope App 20140158901 - Sawada; Hidetaka ; et al.	2014-06-12
Electron microscope Grant 8,541,755 - Sawada September 24, 2	2013-09-24
Transmission electron microscope Grant 8,431,897 - Shibata , et al. April 30, 2	2013-04-30
Spherical aberration corrector and method of spherical aberration correction Grant 8,389,951 - Sawada March 5, 2	2013-03-05
Transmission Electron Microscope App 20120187293 - Shibata; Naoya ; et al.	2012-07-26
Method for Axial Alignment of Charged Particle Beam and Charged Particle Beam System App 20120119107 - Sawada; Hidetaka ; et al.	2012-05-17
Chromatic aberration corrector for charged-particle beam system and correction method therefor Grant 8,178,850 - Sawada , et al. May 15, 2	2012-05-15
Scanning transmission electron microscope and method of aberration correction therefor Grant 8,168,956 - Sawada May 1, 2	2012-05-01
Spherical Aberration Corrector and Method of Spherical Aberration Correction App 20110284758 - Sawada; Hidetaka	2011-11-24
Aberration correction system Grant 7,723,683 - Sawada May 25, 2	2010-05-25
Chromatic Aberration Corrector for Charged-Particle Beam System and Correction Method Therefor App 20100084567 - Sawada; Hidetaka ; et al.	2010-04-08
Aberration Corrector and Charged-Particle Beam System Equipped Therewith App 20100072387 - Sawada; Hidetaka ; et al.	2010-03-25
Method of measuring aberrations and correcting aberrations using Ronchigram and electron microscope Grant 7,619,220 - Sawada , et al. November 17, 2	2009-11-17
Charged-particle beam system Grant 7,598,496 - Sawada , et al. October 6, 2	2009-10-06
Scanning Transmission Electron Microscope and Method of Aberration Correction Therefor App 20090224169 - SAWADA; Hidetaka	2009-09-10
Aberration Correction System App 20090032709 - SAWADA; Hidetaka	2009-02-05
Charged-Particle Beam System App 20080128635 - SAWADA; Hidetaka ; et al.	2008-06-05
Aberration Corrector and Method of Aberration Correction App 20080093563 - Sawada; Hidetaka ; et al.	2008-04-24
Method of measuring aberrations and correcting aberrations using ronchigram and electron microscope App 20070120055 - Sawada; Hidetaka ; et al.	2007-05-31
Apparatus for manufacturing ultra-pure water Grant 5,250,183 - Sawada , et al. October 5, 1	1993-10-05

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.