Sawa; Eiji

Patent Applications and Registrations

Patent applications and USPTO patent grants for Sawa; Eiji.The latest application filed is for "inspection system and method for inspecting line width and/or positional errors of a pattern".

Company Profile

0.15.8

Sawa; Eiji - Kanagawa-ken N/A JP
Sawa; Eiji - Kanagawa JP
Sawa; Eiji - Beek NL
Sawa; Eiji - Yokohama JP
Sawa, Eiji - Yokohama-shi JP
Sawa; Eiji - Gunma-ken JP
Sawa; Eiji - Tokyo JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Pattern characteristic-detection apparatus for photomask and pattern characteristic-detection method for photomask Grant 9,841,385 - Inoue , et al. December 12, 2	2017-12-12
Inspection system and method for inspecting line width and/or positional errors of a pattern Grant 9,406,117 - Touya , et al. August 2, 2	2016-08-02
Inspection System And Method For Inspecting Line Width And/or Positional Errors Of A Pattern App 20150193918 - TOUYA; Takanao ; et al.	2015-07-09
Inspection system and method for inspecting line width and/or positional errors of a pattern Grant 9,036,896 - Touya , et al. May 19, 2	2015-05-19
Conductive coating, method for preparing a coating, roller, and method for manufacturing a roller and using a coating Grant 8,679,370 - Jansen , et al. March 25, 2	2014-03-25
Conductive Coating, Method For Preparing A Coating, Roller, And Method For Manufacturing A Roller And Using A Coating App 20130195517 - JANSEN; John ; et al.	2013-08-01
Conductive coating, method for preparing a coating, roller, and method for manufacturing a roller and using a coating Grant 8,419,977 - Jansen , et al. April 16, 2	2013-04-16
Inspection System And Method For Inspecting Line Width And/or Positional Errors Of A Pattern App 20110255770 - Touya; Takanao ; et al.	2011-10-20
Developing roller, developing apparatus comprising the developing roller, and method for providing the developing roller Grant 7,962,077 - Jansen , et al. June 14, 2	2011-06-14
Pattern Characteristic-detection Apparatus For Photomask And Pattern Characteristic-detection Method For Photomask App 20110058729 - Inoue; Hiromu ; et al.	2011-03-10
Conductive Coating, Method For Preparing A Coating, Roller, And Method For Manufacturing A Roller And Using A Coating App 20090257790 - Jansen; John ; et al.	2009-10-15
Developing Roller, Developing Apparatus Comprising The Developing Roller, And Method For Providing The Developing Roller App 20090257789 - JANSEN; John ; et al.	2009-10-15
Size checking method and apparatus Grant 7,466,854 - Sawa , et al. December 16, 2	2008-12-16
Size checking method and apparatus App 20050265595 - Sawa, Eiji ; et al.	2005-12-01
Size checking method and apparatus Grant 6,965,687 - Sawa , et al. November 15, 2	2005-11-15
Method and apparatus for inspecting patterns Grant 6,888,958 - Sawa , et al. May 3, 2	2005-05-03
Urea derivatives as inhibitors for CCR-3 receptor Grant 6,875,884 - Padia , et al. April 5, 2	2005-04-05
Full-shrink labeled container and tubular shrink label Grant 6,691,439 - Miyashita , et al. February 17, 2	2004-02-17
Size checking method and apparatus App 20020028013 - Sawa, Eiji ; et al.	2002-03-07
Electroconductive polyurethane foam Grant 5,656,344 - Sawa , et al. August 12, 1	1997-08-12

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.