Savtchouk; Alexandre

Patent Applications and Registrations

Patent applications and USPTO patent grants for Savtchouk; Alexandre.The latest application filed is for "charge metrology for integrated measurement".

Company Profile

1.4.5

Savtchouk; Alexandre - Tampa FL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Measuring semiconductor doping using constant surface potential corona charging Grant 10,969,370 - Lagowski , et al. April 6, 2	2021-04-06
Charge Metrology for Integrated Measurement App 20180315630 - Marinskiy; Dmitriy ; et al.	2018-11-01
Measuring semiconductor doping using constant surface potential corona charging App 20160356750 - Lagowski; Jacek ; et al.	2016-12-08
Accurate measuring of long steady state minority carrier diffusion lengths Grant 8,093,920 - Lagowski , et al. January 10, 2	2012-01-10
Accurate Measuring Of Long Steady State Minority Carrier Diffusion Lengths App 20100085073 - Lagowski; Jacek ; et al.	2010-04-08
Enhanced Sensitivity Non-contact Electrical Monitoring Of Copper Contamination On Silicon Surface App 20090047748 - Savtchouk; Alexandre ; et al.	2009-02-19
Determining composition of mixed dielectrics Grant 6,815,974 - Lagowski , et al. November 9, 2	2004-11-09
Method and system for elevated temperature measurement with probes designed for room temperature measurement Grant 6,771,091 - Lagowski , et al. August 3, 2	2004-08-03
Method and system for elevated temperature measurement with probes designed for room temperature measurement App 20040057497 - Lagowski, Jacek J. ; et al.	2004-03-25

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