Sattler; Sebastian

Patent Applications and Registrations

Patent applications and USPTO patent grants for Sattler; Sebastian.The latest application filed is for "component carrier with embedded high-frequency component and integrated waveguide for wireless communication".

Company Profile

2.15.20

Sattler; Sebastian - Graz AT
Sattler; Sebastian - Munchen DE
Sattler; Sebastian - Munich DE
Sattler; Sebastian - Muenchen DE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Component Carrier with Embedded High-Frequency Component and Integrated Waveguide for Wireless Communication App 20220299595 - Goessler; Michael ; et al.	2022-09-22
Component Carrier With Cavity Accommodating at Least Part of Driven Body Being Magnetically Drivable to Move App 20220254554 - Weis; Gerald ; et al.	2022-08-11
Opposing Planar Electrically Conductive Surfaces Connected for Establishing a Two-Dimensional Electric Connection Area Between Component Carrier Stacks App 20220248532 - REITMAIER; Bernhard ; et al.	2022-08-04
Component carrier with opposed stacks having respective connection bodies and a method for manufacturing the component carrier Grant 11,322,482 - Reitmaier , et al. May 3, 2	2022-05-03
Component Carrier With an Embedded Thermally Conductive Block and Manufacturing Method App 20210337653 - Schlaffer; Erich ; et al.	2021-10-28
Electronic Device Having an Electronic Component Packaged in a Compact Component Carrier With Shielding Cavities App 20210059044 - Gentili; Fabrizio ; et al.	2021-02-25
Opposing Planar Electrically Conductive Surfaces Connected for Establishing a Two-Dimensional Electric Connection Area Between Component Carrier Stacks App 20210013182 - Reitmaier; Bernhard ; et al.	2021-01-14
Evaluation circuit and method for detecting and/or locating faulty data words in a data stream T.sub.n Grant 8,060,800 - Goessel , et al. November 15, 2	2011-11-15
Measuring device and method for measuring relative phase shifts of digital signals Grant 7,945,406 - Kirmser , et al. May 17, 2	2011-05-17
Electrical circuit and method for testing electronic component Grant 7,912,667 - Dworski , et al. March 22, 2	2011-03-22
Test apparatus for digitized test responses, method for testing semiconductor devices and diagnosis method for a semiconductor device Grant 7,720,645 - Kirmser , et al. May 18, 2	2010-05-18
Electrical circuit for measuring times and method for measuring times Grant 7,653,170 - Mattes , et al. January 26, 2	2010-01-26
Device and method for measuring jitter Grant 7,558,991 - Mattes , et al. July 7, 2	2009-07-07
Apparatus and method for tolerance analysis for digital and/or digitized measure values Grant 7,487,060 - Oberle , et al. February 3, 2	2009-02-03
Electronic test circuit for an integrated circuit and methods for testing the driver strength and for testing the input sensitivity of a receiver of the integrated circuit Grant 7,471,220 - Mattes , et al. December 30, 2	2008-12-30
Device and method for testing integrated circuits Grant 7,400,995 - Mattes , et al. July 15, 2	2008-07-15
Test apparatus and method for testing analog/digital converters Grant 7,391,349 - Dworski , et al. June 24, 2	2008-06-24
Evaluation Circuit and Method for Detecting and/or Locating Faulty Data Words in a Data Stream Tn App 20080040638 - Goessel; Michael ; et al.	2008-02-14
Apparatus and Method for Tolerance Analysis for Digital and/or Digitized Measure Values App 20070239385 - Oberle; Hans-Dieter ; et al.	2007-10-11
Measuring device and method for measuring relative phase shifts of digital signals App 20070226602 - Kirmser; Stephane ; et al.	2007-09-27
Test Apparatus And Method For Testing Analog/Digital Converters App 20070216555 - Dworski; Claus ; et al.	2007-09-20
Electrical circuit and method for testing integrated circuits Grant 7,256,602 - Mattes , et al. August 14, 2	2007-08-14
Method and device for detecting period length fluctuations of periodic signals Grant 7,254,502 - Oberle , et al. August 7, 2	2007-08-07
Electronic Test Circuit For An Integrated Circuit And Methods For Testing The Driver Strength And For Testing The Input Sensitivity Of A Receiver Of The Integrated Circuit App 20070176807 - Mattes; Heinz ; et al.	2007-08-02
Test apparatus for digitized test responses, method for testing semiconductor devices and diagnosis method for a semiconductor device App 20070089010 - Kirmser; Stephane ; et al.	2007-04-19
Test apparatus and test method for mixed-signal semiconductor components Grant 7,206,712 - Sattler , et al. April 17, 2	2007-04-17
Device and method for testing integrated circuits App 20070067129 - Mattes; Heinz ; et al.	2007-03-22
Electrical circuit and method for testing electronic component App 20070063723 - Dworski; Claus ; et al.	2007-03-22
Device and method for measuring jitter App 20060291548 - Mattes; Heinz ; et al.	2006-12-28
Electrical circuit for measuring times and method for measuring times App 20060274607 - Mattes; Heinz ; et al.	2006-12-07
Test apparatus and test method for mixed-signal semiconductor components App 20060238392 - Sattler; Sebastian ; et al.	2006-10-26
Method and device for detecting period length fluctuations of periodic signals App 20050241362 - Oberle, Hans-Dieter ; et al.	2005-11-03
Electrical circuit and method for testing integrated circuits App 20050231228 - Mattes, Heinz ; et al.	2005-10-20
Method and apparatus for the testing of input/output drivers of a circuit Grant 6,944,810 - Oberle , et al. September 13, 2	2005-09-13
Method and apparatus for the testing of input/output drivers of a circuit App 20030030461 - Oberle, Hans-Dieter ; et al.	2003-02-13

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