loadpatents
name:-0.010381937026978
name:-0.0084309577941895
name:-0.0097339153289795
Sato; Nagisa Patent Filings

Sato; Nagisa

Patent Applications and Registrations

Patent applications and USPTO patent grants for Sato; Nagisa.The latest application filed is for "etching method and etching apparatus".

Company Profile
9.8.9
  • Sato; Nagisa - Tokyo JP
  • Sato; Nagisa - Sendai JP
  • SATO; Nagisa - Sendai-shi JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Semiconductor device manufacturing method and substrate processing apparatus
Grant 11,342,223 - Yamaguchi , et al. May 24, 2
2022-05-24
System, method and computer program product for gas analysis
Grant 11,313,836 - Yamanaka , et al. April 26, 2
2022-04-26
Standard-moisture generator, system using the standard-moisture generator, method for detecting abnormality in standard-moisture and computer program product for detecting the abnormality
Grant 11,307,176 - Tsukahara , et al. April 19, 2
2022-04-19
Etching Method And Etching Apparatus
App 20220102160 - TAHARA; Shigeru ;   et al.
2022-03-31
Resistive change elements using passivating interface gaps and methods for making same
Grant 11,258,023 - Ramsbey , et al. February 22, 2
2022-02-22
Resistive Change Elements Using Passivating Interface Gaps And Methods For Making Same
App 20220045290 - RAMSBEY; Mark ;   et al.
2022-02-10
Method of manufacturing semiconductor memory
Grant 11,139,313 - Lee , et al. October 5, 2
2021-10-05
Plasma etching method
Grant 11,120,999 - Yatsuda , et al. September 14, 2
2021-09-14
Device manufacturing method
Grant 11,069,536 - Lee , et al. July 20, 2
2021-07-20
Method of manufacturing semiconductor device
Grant 10,957,531 - Nozawa , et al. March 23, 2
2021-03-23
Standard-moisture Generator, System Using The Standard-moisture Generator, Method For Detecting Abnormality In Standard-moisture And Computer Program Product For Detecting The Abnormality
App 20200400619 - TSUKAHARA; Yusuke ;   et al.
2020-12-24
Plasma Etching Method
App 20200381264 - YATSUDA; Koichi ;   et al.
2020-12-03
System, Method And Computer Program Product For Gas Analysis
App 20200225190 - YAMANAKA; Kazushi ;   et al.
2020-07-16
Method Of Manufacturing Semiconductor Memory
App 20200152656 - LEE; Sunghil ;   et al.
2020-05-14
Device Manufacturing Method
App 20200152478 - LEE; Sunghil ;   et al.
2020-05-14
Method Of Manufacturing Semiconductor Device
App 20200098561 - NOZAWA; Syuji ;   et al.
2020-03-26
Semiconductor Device Manufacturing Method And Substrate Processing Apparatus
App 20190363011 - YAMAGUCHI; Tatsuya ;   et al.
2019-11-28

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