Sasa; Yasushi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Sasa; Yasushi.The latest application filed is for "image acquisition device, image acquisition method and inspection apparatus".

Company Profile

2.7.10

Sasa; Yasushi - Kyoto JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Image acquisition device, image acquisition method and inspection apparatus Grant 11,283,981 - Sasa March 22, 2	2022-03-22
Image acquisition device, image acquisition method and inspection apparatus Grant 11,252,317 - Sasa February 15, 2	2022-02-15
Misalignment detection device and misalignment detection method Grant 11,060,856 - Sasa July 13, 2	2021-07-13
Image Acquisition Device, Image Acquisition Method And Inspection Apparatus App 20200358935 - Sasa; Yasushi	2020-11-12
Misalignment Detection Device And Misalignment Detection Method App 20200348128 - Sasa; Yasushi	2020-11-05
Inspection apparatus and inspection method Grant 10,613,037 - Nagata , et al.	2020-04-07
Inspection Apparatus And Inspection Method App 20170219495 - NAGATA; Yasushi ; et al.	2017-08-03
Working Unit Control Device, Working Robot, Working Unit Control Method, And Working Unit Control Program App 20140094951 - Sasa; Yasushi	2014-04-03
Defect inspection apparatus, defect inspection method and program Grant 7,440,605 - Sasa , et al. October 21, 2	2008-10-21
Apparatus and method for detecting defects in periodic pattern on object Grant 7,436,993 - Onishi , et al. October 14, 2	2008-10-14
Apparatus and method for detecting defect existing in pattern on object App 20060133660 - Ogi; Hiroshi ; et al.	2006-06-22
Pattern inspection apparatus and method Grant 7,024,041 - Sasa April 4, 2	2006-04-04
Apparatus and method for detecting defects of pattern on object App 20050271261 - Onishi, Hiroyuki ; et al.	2005-12-08
Apparatus and method for inspecting pattern on object App 20050244049 - Onishi, Hiroyuki ; et al.	2005-11-03
Apparatus and method for detecting defects in periodic pattern on object App 20050232478 - Onishi, Hiroyuki ; et al.	2005-10-20
Defect inspection apparatus, defect inspection method and program App 20040066962 - Sasa, Yasushi ; et al.	2004-04-08
Pattern inspection apparatus and method App 20030031356 - Sasa, Yasushi	2003-02-13

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