Sarfaty; Moshe

Patent Applications and Registrations

Patent applications and USPTO patent grants for Sarfaty; Moshe.The latest application filed is for "methods for detection and characterization of abnormal tissue and cells using an electrical system".

Company Profile

0.29.19

Sarfaty; Moshe - Cupertino CA US

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Optical system for detection and characterization of abnormal tissue and cells Grant 9,566,030 - Sarfaty , et al. February 14, 2	2017-02-14
Methods for optical identification and characterization of abnormal tissue and cells Grant 9,554,743 - Sarfaty , et al. January 31, 2	2017-01-31
Methods for detection and characterization of abnormal tissue and cells using an electrical system Grant 8,865,076 - Sarfaty , et al. October 21, 2	2014-10-21
Methods For Detection And Characterization Of Abnormal Tissue And Cells Using An Electrical System App 20130230883 - SARFATY; Moshe ; et al.	2013-09-05
Electrical methods for detection and characterization of abnormal tissue and cells Grant 8,437,845 - Sarfaty , et al. May 7, 2	2013-05-07
Electrical systems for detection and characterization of abnormal tissue and cells Grant 8,417,328 - Sarfaty , et al. April 9, 2	2013-04-09
Method, system and medium for controlling manufacturing process using adaptive models based on empirical data Grant 7,970,588 - Kokotov , et al. June 28, 2	2011-06-28
Optical System For Detection And Characterization Of Abnormal Tissue And Cells App 20100179436 - Sarfaty; Moshe ; et al.	2010-07-15
Electrical Systems For Detection And Characterization Of Abnormal Tissue And Cells App 20100121173 - Sarfaty; Moshe ; et al.	2010-05-13
Electrical Methods For Detection And Characterization Of Abnormal Tissue And Cells App 20100106047 - Sarfaty; Moshe ; et al.	2010-04-29
Methods For Optical Identification And Characterization Of Abnormal Tissue And Cells App 20100106025 - Sarfaty; Moshe ; et al.	2010-04-29
Method, system and medium for controlling manufacturing process using adaptive models based on empirical data Grant 7,668,702 - Kokotov , et al. February 23, 2	2010-02-23
Method, system and medium for controlling manufacturing process using adaptive models based on empirical data App 20080177408 - Kokotov; Yuri ; et al.	2008-07-24
Material composition analysis system and method Grant 7,358,494 - Gao , et al. April 15, 2	2008-04-15
Integrated equipment set for forming a low K dielectric interconnect on a substrate App 20060246683 - Pan; Judon Tony ; et al.	2006-11-02
Direct non contact measurement Grant 7,046,019 - Sarfaty , et al. May 16, 2	2006-05-16
Eddy-optic sensor for object inspection Grant 7,042,558 - Sarfaty , et al. May 9, 2	2006-05-09
Method and apparatus for process monitoring Grant 6,936,842 - Rengarajan , et al. August 30, 2	2005-08-30
Method and apparatus for monitoring a process by employing principal component analysis Grant 6,896,763 - Balasubramhanya , et al. May 24, 2	2005-05-24
In-situ film thickness measurement using spectral interference at grazing incidence Grant 6,888,639 - Goebel , et al. May 3, 2	2005-05-03
Current leakage measurement Grant 6,855,569 - Sarfaty February 15, 2	2005-02-15
Detecting chemiluminescent radiation in the cleaning of a substrate processing chamber Grant 6,843,881 - Kim , et al. January 18, 2	2005-01-18
Eddy current-capacitance sensor for conducting film characterization App 20040207395 - Sarfaty, Moshe ; et al.	2004-10-21
Detection of process endpoint through monitoring fluctuation of output data Grant 6,745,095 - Ben-Dov , et al. June 1, 2	2004-06-01
Differential measurement method using eddy-current sensing to resolve a stack of conducting films on substrates App 20040070393 - Sarfaty, Moshe ; et al.	2004-04-15
Method, system and medium for controlling manufacturing process using adaptive models based on empirical data App 20040015335 - Kokotov, Yuri ; et al.	2004-01-22
Integrated equipment set for forming a low K dielectric interconnect on a substrate App 20040007325 - Pan, Judon Tony ; et al.	2004-01-15
Monitoring of film characteristics during plasma-based semi-conductor processing using optical emission spectroscopy Grant 6,633,391 - Oluseyi , et al. October 14, 2	2003-10-14
Detecting chemiluminescent radiation in the cleaning of a substrate processing chamber App 20030185966 - Kim, Bok Hoen ; et al.	2003-10-02
Situ measurement of film nitridation using optical emission spectroscopy Grant 6,627,463 - Sarfaty September 30, 2	2003-09-30
Eddy-optic sensor for object inspection Grant 6,608,495 - Sarfaty , et al. August 19, 2	2003-08-19
Method and apparatus employing optical emission spectroscopy to detect a fault in process conditions of a semiconductor processing system Grant 6,603,538 - Oluseyi , et al. August 5, 2	2003-08-05
Method and apparatus for monitoring a process by employing principal component analysis App 20030136511 - Balasubramhanya, Lalitha ; et al.	2003-07-24
Spectral reflectance for in-situ film characteristic measurements App 20030133126 - Sarfaty, Moshe ; et al.	2003-07-17
Film thickness control using spectral interferometry Grant 6,589,869 - Sarfaty , et al. July 8, 2	2003-07-08
In-situ film thickness measurement using spectral interference at grazing incidence App 20030090676 - Goebel, Andreas ; et al.	2003-05-15
Method and apparatus for monitoring a process by employing principal component analysis Grant 6,521,080 - Balasubramhanya , et al. February 18, 2	2003-02-18
Method and apparatus for process monitoring App 20030032207 - Rengarajan, Suraj ; et al.	2003-02-13
Method and apparatus for monitoring the process state of a semiconductor device fabrication process Grant 6,455,437 - Davidow , et al. September 24, 2	2002-09-24
Eddy-optic sensor for object inspection App 20020130651 - Sarfaty, Moshe ; et al.	2002-09-19
Film thickness control using spectral interferometry App 20020119660 - Sarfaty, Moshe ; et al.	2002-08-29
Film thickness control using spectral interferometry Grant 6,413,867 - Sarfaty , et al. July 2, 2	2002-07-02
Method and apparatus for monitoring a process by employing principal component analysis App 20020055259 - Balasubramhanya, Lalitha ; et al.	2002-05-09
Method and apparatus for monitoring a process by employing principal component analysis Grant 6,368,975 - Balasubramhanya , et al. April 9, 2	2002-04-09

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.