Saraswatula; Jagdish
Patent Applications and Registrations
Patent applications and USPTO patent grants for Saraswatula; Jagdish.The latest application filed is for "guided metrology based on wafer topography".
- Saraswatula; Jagdish - Chennai IN
| Patent | Date |
|---|---|
| Guided scanning electron microscopy metrology based on wafer topography Grant 10,957,608 - Yati , et al. March 23, 2 | 2021-03-23 |
| Guided Metrology Based on Wafer Topography App 20180315670 - Yati; Arpit ; et al. | 2018-11-01 |
| Shape based grouping Grant 9,965,848 - Banerjee , et al. May 8, 2 | 2018-05-08 |
| Shape Based Grouping App 20170186151 - Banerjee; Saibal ; et al. | 2017-06-29 |
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