Sappey; Romain

Patent Applications and Registrations

Patent applications and USPTO patent grants for Sappey; Romain.The latest application filed is for "system and method for defect detection and photoluminescence measurement of a sample".

Company Profile

1.8.9

Sappey; Romain - San Jose CA
Sappey; Romain - Tucson AZ
Sappey; Romain - San Diego CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
System and method for defect detection and photoluminescence measurement of a sample Grant 9,772,289 - Sappey September 26, 2	2017-09-26
System and Method for Defect Detection and Photoluminescence Measurement of a Sample App 20160377548 - Sappey; Romain	2016-12-29
Methods and apparatus for spectral luminescence measurement Grant 9,410,890 - Sappey August 9, 2	2016-08-09
System and method for defect detection and photoluminescence measurement of a sample Grant 9,354,177 - Sappey May 31, 2	2016-05-31
System and Method for Defect Detection and Photoluminescence Measurement of a Sample App 20150001421 - Sappey; Romain	2015-01-01
Substrate inspection Grant 8,736,831 - Ramachandran , et al. May 27, 2	2014-05-27
Substrate Inspection App 20130308124 - Ramachandran; Mahendra Prabhu ; et al.	2013-11-21
Methods And Apparatus For Spectral Luminescence Measurement App 20130242300 - SAPPEY; Romain	2013-09-19
Measuring the shape and thickness variation of a wafer with high slopes Grant 7,847,954 - Tang , et al. December 7, 2	2010-12-07
Measuring The Shape And Thickness Variation Of A Wafer With High Slopes App 20090284734 - Tang; Shouhong ; et al.	2009-11-19
Surface characteristic analysis Grant 7,554,654 - Meeks , et al. June 30, 2	2009-06-30
Dynamic reference plane compensation Grant 7,505,143 - Hess , et al. March 17, 2	2009-03-17
Surface Characteristic Analysis App 20080180656 - Meeks; Steven W. ; et al.	2008-07-31
Dynamic reference plane compensation App 20060262291 - Hess; Harald F. ; et al.	2006-11-23
Interferometry measurement in disturbed environments App 20060256345 - Sappey; Romain	2006-11-16

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