| Patent | Date |
|---|
Method and Apparatus for Measuring Vision Function
App 20220304570 - Sapiens; Noam ; et al. | 2022-09-29 |
Methods and Systems for Automatic Measurements of Optical Systems
App 20220265141 - Sapiens; Noam ; et al. | 2022-08-25 |
Method and system for providing a quality metric for improved process control
Grant 11,372,340 - Kandel , et al. June 28, 2 | 2022-06-28 |
Methods and Apparatus for Addressing Presbyopia
App 20220087522 - Sapiens; Noam ; et al. | 2022-03-24 |
Variable aperture mask
Grant 11,268,901 - Blasenheim , et al. March 8, 2 | 2022-03-08 |
Means and Methods of Measuring Refraction
App 20210338077 - Sapiens; Noam ; et al. | 2021-11-04 |
Automated personal vision tracker
Grant D933,829 - Serri , et al. October 19, 2 | 2021-10-19 |
Methods and systems for measurement of thick films and high aspect ratio structures
Grant 11,119,050 - Sapiens , et al. September 14, 2 | 2021-09-14 |
Method And Apparatus For Refraction And Vision Measurement
App 20200352436 - Sapiens; Noam ; et al. | 2020-11-12 |
Methods And Systems For Measurement Of Thick Films And High Aspect Ratio Structures
App 20200284733 - Sapiens; Noam ; et al. | 2020-09-10 |
Variable Aperture Mask
App 20200271569 - Blasenheim; Barry ; et al. | 2020-08-27 |
Method and Apparatus for Measurement of a Characteristic of an Optical System
App 20200196859 - Serri; John ; et al. | 2020-06-25 |
Methods and systems for measurement of thick films and high aspect ratio structures
Grant 10,690,602 - Sapiens , et al. | 2020-06-23 |
Refraction Measurement of the Human Eye with a Reverse Wavefront Sensor
App 20200178793 - Sapiens; Noam | 2020-06-11 |
Method and Apparatus for Modeling an Eye
App 20200170500 - Sapiens; Noam | 2020-06-04 |
Variable aperture mask
Grant 10,663,392 - Blasenheim , et al. | 2020-05-26 |
Optical metrology with small illumination spot size
Grant 10,648,796 - Sapiens , et al. | 2020-05-12 |
Calibration and Image Procession Methods and Systems for Obtaining Accurate Pupillary Distance Measurements
App 20200107720 - Xiong; Yuan ; et al. | 2020-04-09 |
Measurement of multiple patterning parameters
Grant 10,612,916 - Shchegrov , et al. | 2020-04-07 |
Symmetric target design in scatterometry overlay metrology
Grant 10,591,406 - Bringoltz , et al. | 2020-03-17 |
Optical method to assess the refractive properties of an optical system
Grant 10,588,507 - Skolianos , et al. | 2020-03-17 |
Automated Personal Vision Tracker
App 20200077886 - Serri; John ; et al. | 2020-03-12 |
Overlay metrology using multiple parameter configurations
Grant 10,401,738 - Hill , et al. Sep | 2019-09-03 |
Systems and methods for metrology beam stabilization
Grant 10,365,211 - Blasenheim , et al. July 30, 2 | 2019-07-30 |
Optical Method to Assess the Refractive Properties of an Optical System
App 20190175013 - Skolianos; Georgios ; et al. | 2019-06-13 |
Structured illumination for contrast enhancement in overlay metrology
Grant 10,274,425 - Seligson , et al. | 2019-04-30 |
Near field metrology
Grant 10,261,014 - Sapiens , et al. | 2019-04-16 |
Systems And Methods For Metrology Beam Stabilization
App 20190094130 - Blasenheim; Barry ; et al. | 2019-03-28 |
Method and system for spectroscopic beam profile metrology including a detection of collected light according to wavelength along a third dimension of a hyperspectral detector
Grant 10,234,271 - Fu , et al. | 2019-03-19 |
Variable Aperture Mask
App 20190049365 - Blasenheim; Barry ; et al. | 2019-02-14 |
Overlay Metrology Using Multiple Parameter Configurations
App 20190041329 - Hill; Andrew V. ; et al. | 2019-02-07 |
Methods And Systems For Spectroscopic Beam Profile Metrology
App 20180347961 - Fu; Jiyou ; et al. | 2018-12-06 |
Apparatus, techniques, and target designs for measuring semiconductor parameters
Grant 10,107,765 - Sapiens , et al. October 23, 2 | 2018-10-23 |
Spectroscopic beam profile overlay metrology
Grant 10,101,676 - Fu , et al. October 16, 2 | 2018-10-16 |
Methods and systems for spectroscopic beam profile metrology having a first two dimensional detector to detect collected light transmitted by a first wavelength dispersive element
Grant 10,072,921 - Fu , et al. September 11, 2 | 2018-09-11 |
Compressive sensing for metrology
Grant 10,062,157 - Pandev , et al. August 28, 2 | 2018-08-28 |
Methods And Systems For Measurement Of Thick Films And High Aspect Ratio Structures
App 20180238814 - Sapiens; Noam ; et al. | 2018-08-23 |
Optical Metrology With Small Illumination Spot Size
App 20180180406 - Sapiens; Noam ; et al. | 2018-06-28 |
Optical metrology with small illumination spot size
Grant 9,915,524 - Sapiens , et al. March 13, 2 | 2018-03-13 |
Measurement Of Multiple Patterning Parameters
App 20180051984 - Shchegrov; Andrei V. ; et al. | 2018-02-22 |
Apparatus, Techniques, And Target Designs For Measuring Semiconductor Parameters
App 20170356853 - Sapiens; Noam ; et al. | 2017-12-14 |
Measurement of multiple patterning parameters
Grant 9,816,810 - Shchegrov , et al. November 14, 2 | 2017-11-14 |
Structured Illumination for Contrast Enhancement in Overlay Metrology
App 20170307523 - Seligson; Joel ; et al. | 2017-10-26 |
Apparatus, techniques, and target designs for measuring semiconductor parameters
Grant 9,784,690 - Sapiens , et al. October 10, 2 | 2017-10-10 |
Measurement systems having linked field and pupil signal detection
Grant 9,739,719 - Fu , et al. August 22, 2 | 2017-08-22 |
Symmetric target design in scatterometry overlay metrology
Grant 9,739,702 - Bringoltz , et al. August 22, 2 | 2017-08-22 |
Structured illumination for contrast enhancement in overlay metrology
Grant 9,645,079 - Seligson , et al. May 9, 2 | 2017-05-09 |
Spectroscopic Beam Profile Overlay Metrology
App 20170082932 - Fu; Jiyou ; et al. | 2017-03-23 |
Compressive Sensing For Metrology
App 20170076440 - Pandev; Stilian Ivanov ; et al. | 2017-03-16 |
Phase characterization of targets
Grant 9,581,430 - Manassen , et al. February 28, 2 | 2017-02-28 |
Metrology target indentification, design and verification
Grant 9,546,946 - Golovanevsky , et al. January 17, 2 | 2017-01-17 |
Measurement Of Multiple Patterning Parameters
App 20170003123 - Shchegrov; Andrei V. ; et al. | 2017-01-05 |
Compressive sensing for metrology
Grant 9,518,916 - Pandev , et al. December 13, 2 | 2016-12-13 |
Optical Metrology With Small Illumination Spot Size
App 20160334326 - Sapiens; Noam ; et al. | 2016-11-17 |
Measurement of multiple patterning parameters
Grant 9,490,182 - Shchegrov , et al. November 8, 2 | 2016-11-08 |
Symmetric Target Design In Scatterometry Overlay Metrology
App 20160216197 - Bringoltz; Barak ; et al. | 2016-07-28 |
Spectroscopic Beam Profile Metrology
App 20160161245 - Fu; Jiyou ; et al. | 2016-06-09 |
Measurement Systems Having Linked Field And Pupil Signal Detection
App 20160123894 - Fu; Jiyou ; et al. | 2016-05-05 |
Angle-resolved antisymmetric scatterometry
Grant 9,255,895 - Kandel , et al. February 9, 2 | 2016-02-09 |
Structured Illumination for Contrast Enhancement in Overlay Metrology
App 20160003735 - Seligson; Joel ; et al. | 2016-01-07 |
Apparatus, Techniques, And Target Designs For Measuring Semiconductor Parameters
App 20150323471 - Sapiens; Noam ; et al. | 2015-11-12 |
Optics symmetrization for metrology
Grant 9,164,397 - Manassen , et al. October 20, 2 | 2015-10-20 |
Metrology Target Indentification, Design And Verification
App 20150233814 - Golovanevsky; Boris ; et al. | 2015-08-20 |
Structured illumination for contrast enhancement in overlay metrology
Grant 9,104,120 - Seligson , et al. August 11, 2 | 2015-08-11 |
Symmetric Target Design In Scatterometry Overlay Metrology
App 20150204664 - Bringoltz; Barak ; et al. | 2015-07-23 |
Near Field Metrology
App 20150198524 - Sapiens; Noam ; et al. | 2015-07-16 |
Angle-Resolved Antisymmetric Scatterometry
App 20150177162 - Kandel; Daniel ; et al. | 2015-06-25 |
Measurement Of Multiple Patterning Parameters
App 20150176985 - Shchegrov; Andrei V. ; et al. | 2015-06-25 |
Method And Apparatus For Scatterometric Measurement Of Human Tissue
App 20150157199 - Sapiens; Noam | 2015-06-11 |
Angle-resolved antisymmetric scatterometry
Grant 8,848,186 - Kandel , et al. September 30, 2 | 2014-09-30 |
Phase Characterization Of Targets
App 20140111791 - Manassen; Amnon ; et al. | 2014-04-24 |
Illumination control
Grant 8,681,413 - Manassen , et al. March 25, 2 | 2014-03-25 |
Overlay metrology by pupil phase analysis
Grant 8,582,114 - Manassen , et al. November 12, 2 | 2013-11-12 |
Communication System And Method For Managing Data Transfer Through A Communication Network
App 20130066951 - Agranat; Aharon ; et al. | 2013-03-14 |
Overlay Metrology By Pupil Phase Analysis
App 20130044331 - Manassen; Amnon ; et al. | 2013-02-21 |
Method And System For Providing A Quality Metric For Improved Process Control
App 20130035888 - Kandel; Daniel ; et al. | 2013-02-07 |
Illumination Control
App 20120327503 - Manassen; Amnon ; et al. | 2012-12-27 |
Structured Illumination For Contrast Enhancement In Overlay Metrology
App 20120206729 - Seligson; Joel ; et al. | 2012-08-16 |
Angle-resolved Antisymmetric Scatterometry
App 20120120396 - Kandel; Daniel ; et al. | 2012-05-17 |
Optics Symmetrization For Metrology
App 20120033226 - Manassen; Amnon ; et al. | 2012-02-09 |
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