Sannomiya; Takumi
Patent Applications and Registrations
Patent applications and USPTO patent grants for Sannomiya; Takumi.The latest application filed is for "transmission electron microscope".
- Sannomiya; Takumi - Kochi-Ken JP
| Patent | Date |
|---|---|
| Transmission electron microscope Grant 7,683,320 - Sannomiya , et al. March 23, 2 | 2010-03-23 |
| Method of measuring aberrations and correcting aberrations using Ronchigram and electron microscope Grant 7,619,220 - Sawada , et al. November 17, 2 | 2009-11-17 |
| Transmission Electron Microscope App 20080011949 - Sannomiya; Takumi ; et al. | 2008-01-17 |
| Method of measuring aberrations and correcting aberrations using ronchigram and electron microscope App 20070120055 - Sawada; Hidetaka ; et al. | 2007-05-31 |
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