Sankaranarayanan; Balamurugan

Patent Applications and Registrations

Patent applications and USPTO patent grants for Sankaranarayanan; Balamurugan.The latest application filed is for "distributed analysis x-ray inspection methods and systems".

Company Profile

6.6.6

Sankaranarayanan; Balamurugan - Kent WA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Distributed Analysis X-Ray Inspection Methods and Systems App 20210405243 - Parikh; Shehul Sailesh ; et al.	2021-12-30
Distributed analysis x-ray inspection methods and systems Grant 11,099,294 - Parikh , et al. August 24, 2	2021-08-24
Distributed analysis X-ray inspection methods and systems Grant 10,830,920 - Parikh , et al. November 10, 2	2020-11-10
Distributed Analysis X-Ray Inspection Methods and Systems App 20200073008 - Parikh; Shehul Sailesh ; et al.	2020-03-05
Distributed Analysis X-Ray Inspection Methods and Systems App 20200073009 - Parikh; Shehul Sailesh ; et al.	2020-03-05
Distributed analysis x-ray inspection methods and systems Grant 10,509,142 - Parikh , et al. Dec	2019-12-17
X-ray inspection system that integrates manifest data with imaging/detection processing Grant 10,422,919 - Parikh , et al. Sept	2019-09-24
Distributed Analysis X-Ray Inspection Methods and Systems App 20190162873 - Parikh; Shehul Sailesh ; et al.	2019-05-30
X-ray inspection system that integrates manifest data with imaging/detection processing Grant 9,111,331 - Parikh , et al. August 18, 2	2015-08-18
X-ray Inspection System That Integrates Manifest Data With Imaging/detection Processing App 20130101172 - Parikh; Shehul Sailesh ; et al.	2013-04-25

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