Samsavar; Amin
Patent Applications and Registrations
Patent applications and USPTO patent grants for Samsavar; Amin.The latest application filed is for "method and apparatus for laser machining".
- Samsavar; Amin - Lake Oswego OR US
- Samsavar; Amin - Saratoga CA
- Samsavar; Amin - San Jose CA
- Samsavar; Amin - Sunnyvale CA
| Patent | Date |
|---|---|
| Method for laser machining a sample having a crystalline structure Grant 8,853,592 - Straw , et al. October 7, 2 | 2014-10-07 |
| Method and Apparatus for Laser Machining App 20110115129 - Straw; Marcus ; et al. | 2011-05-19 |
| Systems configured to perform a non-contact method for determining a property of a specimen Grant 7,719,294 - Samsavar , et al. May 18, 2 | 2010-05-18 |
| Contactless charge measurement of product wafers and control of corona generation and deposition Grant 7,538,333 - Samsavar , et al. May 26, 2 | 2009-05-26 |
| Methods and systems for determining a property of an insulating film Grant 7,358,748 - Miller , et al. April 15, 2 | 2008-04-15 |
| System for sensing a sample Grant 7,278,301 - McWaid , et al. October 9, 2 | 2007-10-09 |
| Contactless charge measurement of product wafers and control of corona generation and deposition Grant 7,248,062 - Samsavar , et al. July 24, 2 | 2007-07-24 |
| System for Sensing a Sample App 20060230819 - McWaid; Thomas ; et al. | 2006-10-19 |
| System for Sensing a Sample App 20060207318 - McWaid; Thomas ; et al. | 2006-09-21 |
| Dual stage instrument for scanning a specimen Grant 7,100,430 - Samsavar , et al. September 5, 2 | 2006-09-05 |
| Methods and systems for determining a property of an insulating film Grant 7,012,438 - Miller , et al. March 14, 2 | 2006-03-14 |
| System for sensing a sample App 20050262931 - McWaid, Thomas ; et al. | 2005-12-01 |
| System for sensing a sample Grant 6,931,917 - McWaid , et al. August 23, 2 | 2005-08-23 |
| Dual stage instrument for scanning a specimen App 20050005688 - Samsavar, Amin ; et al. | 2005-01-13 |
| Tank probe for measuring surface conductance Grant 6,794,886 - Chen , et al. September 21, 2 | 2004-09-21 |
| Method and system for detecting metal contamination on a semiconductor wafer Grant 6,759,255 - Xu , et al. July 6, 2 | 2004-07-06 |
| System for sensing a sample App 20040118193 - McWaid, Thomas ; et al. | 2004-06-24 |
| Dual stage instrument for scanning a specimen App 20030089162 - Samsavar, Amin ; et al. | 2003-05-15 |
| System for sensing a sample App 20030089163 - McWaid, Thomas ; et al. | 2003-05-15 |
| System For Sensing A Sample App 20020174714 - MCWAID, THOMAS ; et al. | 2002-11-28 |
| Method and system for detecting metal contamination on a semiconductor wafer App 20020090746 - Xu, Zhiwei ; et al. | 2002-07-11 |
| Dual stage instrument for scanning a specimen App 20010047682 - Samsavar, Amin ; et al. | 2001-12-06 |
| Optical profilometer combined with stylus probe measurement device Grant 5,955,661 - Samsavar , et al. September 21, 1 | 1999-09-21 |
| Dual stage instrument for scanning a specimen Grant 5,948,972 - Samsavar , et al. September 7, 1 | 1999-09-07 |
| Acoustic sensor as proximity detector Grant 5,852,232 - Samsavar , et al. December 22, 1 | 1998-12-22 |
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