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Non-destructive recirculation test support for integrated circuits
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Methods and systems for performing test and calibration of integrated sensors
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Functional diagnostics based on dynamic selection of alternate clocking
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Performing system functional test on a chip having partial-good portions
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Functional diagnostics based on dynamic selection of alternate clocking
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Methods and systems for performing test and calibration of integrated sensors
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Structurally assisted functional test and diagnostics for integrated circuits
Grant 10,247,776 - Kusko , et al. | 2019-04-02 |
Functional Diagnostics Based On Dynamic Selection Of Alternate Clocking
App 20190094297 - Kusko; Mary P. ; et al. | 2019-03-28 |
Functional Diagnostics Based On Dynamic Selection Of Alternate Clocking
App 20190094298 - Kusko; Mary P. ; et al. | 2019-03-28 |
Methods and systems for generating functional test patterns for manufacture test
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Methods and systems for generating functional test patterns for manufacture test
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Methods And Systems For Performing Test And Calibration Of Integrated Sensors
App 20180306610 - Agrawal; Mitesh ; et al. | 2018-10-25 |
Structurally Assisted Functional Test And Diagnostics For Integrated Circuits
App 20180238962 - Kusko; Mary P. ; et al. | 2018-08-23 |
Non-destructive Recirculation Test Support For Integrated Circuits
App 20180238964 - Kusko; Mary P. ; et al. | 2018-08-23 |
Methods And Systems For Generating Functional Test Patterns For Manufacture Test
App 20180067162 - Motika; Franco ; et al. | 2018-03-08 |
Methods and systems for generating functional test patterns for manufacture test
Grant 9,857,422 - Motika , et al. January 2, 2 | 2018-01-02 |
Performing System Functional Test On A Chip Having Partial-good Portions
App 20170261551 - Agrawal; Mitesh A. ; et al. | 2017-09-14 |
Methods And Systems For Generating Functional Test Patterns For Manufacture Test
App 20170261552 - Motika; Franco ; et al. | 2017-09-14 |
Methods And Systems For Generating Functional Test Patterns For Manufacture Test
App 20170261554 - Motika; Franco ; et al. | 2017-09-14 |
Optimized chain diagnostic fail isolation
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Core diagnostics and repair
Grant 8,984,335 - Anandavally , et al. March 17, 2 | 2015-03-17 |
Multi-core diagnostics and repair using firmware and spare cores
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Core Diagnostics And Repair
App 20140108859 - Anandavally; Sreekala ; et al. | 2014-04-17 |
Core Diagnostics And Repair
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Clock-based debugging for embedded dynamic random access memory element in a processor core
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Support element office mode array repair code verification
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Radio frequency-enabled electromigration fuse
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Loading And Unloading A Memory Element For Debug
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Radio Frequency-enabled Electromigration Fuse
App 20110187407 - Iyer; Subramanian S. ; et al. | 2011-08-04 |
Support Element Office Mode Array Repair Code Verification
App 20110113295 - McCain; Edward C. ; et al. | 2011-05-12 |
System and Method of Multi-Frequency Integrated Circuit Testing
App 20080282123 - Meissner; Charles L. ; et al. | 2008-11-13 |
Testing of ECC memories
Grant 7,308,621 - Adams , et al. December 11, 2 | 2007-12-11 |
Method and system for performing static timing analysis on digital electronic circuits
Grant 7,194,715 - Charlebois , et al. March 20, 2 | 2007-03-20 |
Optimized ECC/redundancy fault recovery
Grant 7,149,941 - Adams , et al. December 12, 2 | 2006-12-12 |
Method and circuit for dynamic read margin control of a memory array
Grant 7,042,776 - Canada , et al. May 9, 2 | 2006-05-09 |
System and method for synchronizing divide-by counters
Grant 6,989,696 - Hilgendorf , et al. January 24, 2 | 2006-01-24 |
Method And System For Performing Static Timing Analysis On Digital Electronic Circuits
App 20050246673 - Charlebois, Steven E. ; et al. | 2005-11-03 |
Method And Circuit For Dynamic Read Margin Control Of A Memory Array
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System And Method For Synchronizing Divide-by Counters
App 20050104637 - Hilgendorf, Rolf ; et al. | 2005-05-19 |
Array-built-in-self-test (ABIST) for efficient, fast, bitmapping of large embedded arrays in manufacturing test
Grant 6,643,807 - Heaslip , et al. November 4, 2 | 2003-11-04 |
Testing of ECC memories
App 20030204795 - Adams, R. Dean ; et al. | 2003-10-30 |
Optimized ECC/redundancy fault recovery
App 20030204798 - Adams, R. Dean ; et al. | 2003-10-30 |
Method for testing adapter card ASIC using reconfigurable logic
Grant 5,844,917 - Salem , et al. December 1, 1 | 1998-12-01 |
Apparatus for testing an adapter card ASIC with reconfigurable logic
Grant 5,841,790 - Salem , et al. November 24, 1 | 1998-11-24 |
System for independently transferring data using two independently controlled DMA engines coupled between a FIFO buffer and two separate buses respectively
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Method of I/O pin assignment in a hierarchial packaging system
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