Saleh; Nedal R.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Saleh; Nedal R..The latest application filed is for "spectrometry employing extinction coefficient modulation".
- Saleh; Nedal R. - Hopewell Junction NY US
- Saleh; Nedal R. - Santa Clara CA
| Patent | Date |
|---|---|
| Scatterometry measurement of line edge roughness in the bright field Grant 9,091,942 - Saleh July 28, 2 | 2015-07-28 |
| Spectrometry employing extinction coefficient modulation Grant 8,860,956 - Saleh , et al. October 14, 2 | 2014-10-14 |
| Spectrometry Employing Extinction Coefficient Modulation App 20140268181 - Saleh; Nedal R. ; et al. | 2014-09-18 |
| In-situ Active Wafer Charge Screening By Conformal Grounding App 20140073114 - Cen; Cheng ; et al. | 2014-03-13 |
| In-situ Active Wafer Charge Screening By Conformal Grounding App 20130200501 - Cen; Cheng ; et al. | 2013-08-08 |
| Scatterometry Measurement Of Line Edge Roughness In The Bright Field App 20130132036 - Saleh; Nedal R. | 2013-05-23 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.
| 