Salapaka; Murti V.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Salapaka; Murti V..The latest application filed is for "method to transiently detect sample features using cantilevers".
- Salapaka; Murti V. - Plymouth MN
- Salapaka; Murti V. - Ames IA
| Patent | Date |
|---|---|
| Virtual impedance shaping Grant 9,712,040 - Kim , et al. July 18, 2 | 2017-07-18 |
| Observer based Q-control imaging methods for atomic force microscopy Grant 7,627,438 - Salapaka , et al. December 1, 2 | 2009-12-01 |
| Method to transiently detect sample features using cantilevers Grant 7,360,405 - Salapaka , et al. April 22, 2 | 2008-04-22 |
| Real time detection of loss of cantilever sensing loss Grant 7,313,948 - Salapaka , et al. January 1, 2 | 2008-01-01 |
| Method To Transiently Detect Sample Features Using Cantilevers App 20060254346 - Salapaka; Murti V. ; et al. | 2006-11-16 |
| Real Time Detection of Loss of Cantilever Sensing Loss App 20060213261 - Salapaka; Murti V. ; et al. | 2006-09-28 |
| Method to transiently detect samples in atomic force microscopes Grant 7,066,014 - Salapaka , et al. June 27, 2 | 2006-06-27 |
| Method to transiently detect samples in atomic force microscopes App 20050066713 - Salapaka, Murti V. ; et al. | 2005-03-31 |
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