Sakurai; Yuichi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Sakurai; Yuichi.The latest application filed is for "work support device, work support method, and work support program".

Company Profile

5.13.17

Sakurai; Yuichi - Tokyo JP
Sakurai; Yuichi - Sendai JP
SAKURAI; Yuichi - Sendai-shi JP
Sakurai; Yuichi - Yokohama N/A JP
Sakurai; Yuichi - Maebashi-shi JP
Sakurai; Yuichi - Kitakyushi JP
Sakurai; Yuichi - Miyagi JP
Sakurai; Yuichi - Fukuoka JP
Sakurai, Yuichi - Toride-shi JP
Sakurai; Yuichi - Toride JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Work support device, work support method, and work support program Grant 11,392,871 - Sakurai , et al. July 19, 2	2022-07-19
Facility state determination device, facility state determination method, and facility management system Grant 10,908,595 - Sakurai , et al. February 2, 2	2021-02-02
Work Support Device, Work Support Method, And Work Support Program App 20200401972 - SAKURAI; Yuichi ; et al.	2020-12-24
State identification device, state identification method and mechanical device Grant 10,845,794 - Sakai , et al. November 24, 2	2020-11-24
Charged particle beam device and image processing method in charged particle beam device Grant 10,763,078 - Kamio , et al. Sep	2020-09-01
Charged Particle Beam Device And Image Processing Method In Charged Particle Beam Device App 20200066484 - KAMIO; Masato ; et al.	2020-02-27
Charged particle beam device and image processing method in charged particle beam device Grant 10,522,325 - Kamio , et al. Dec	2019-12-31
Facility State Determination Device, Facility State Determination Method, And Facility Management System App 20190384268 - SAKURAI; Yuichi ; et al.	2019-12-19
State Identification Device, State Identification Method And Mechanical Device App 20190324428 - SAKAI; Hideo ; et al.	2019-10-24
Charged Particle Beam Device And Image Processing Method In Charged Particle Beam Device App 20180301316 - KAMIO; Masato ; et al.	2018-10-18
Wireless power transmission device Grant 9,935,456 - Mori , et al. April 3, 2	2018-04-03
Data processing device, semiconductor external view inspection device, and data volume increase alleviation method Grant 9,489,324 - Sakurai , et al. November 8, 2	2016-11-08
Wireless Power Transmission Device App 20160020600 - MORI; Masashi ; et al.	2016-01-21
Communication Apparatus And Electronic Device App 20150280429 - Makita; Kazumasa ; et al.	2015-10-01
Data Processing Device, Semiconductor External View Inspection Device, And Data Volume Increase Alleviation Method App 20140372656 - Sakurai; Yuichi ; et al.	2014-12-18
Semiconductor Inspecting Apparatus App 20130136334 - Sakurai; Yuichi ; et al.	2013-05-30
Method and apparatus for inspecting defects of semiconductor device Grant 8,385,627 - Toba , et al. February 26, 2	2013-02-26
Ball Screw App 20120132025 - Sakurai; Yuichi	2012-05-31
Semiconductor inspecting apparatus Grant 8,032,332 - Sakurai , et al. October 4, 2	2011-10-04
Semiconductor Inspecting Apparatus App 20080262760 - Sakurai; Yuichi ; et al.	2008-10-23
Raw material feeding apparatus for rotary hearth furnace Grant 7,311,519 - Shima , et al. December 25, 2	2007-12-25
IC tag, IC tag system, and data communicating method for the IC tag App 20070069865 - Akiyama; Kazuhiro ; et al.	2007-03-29
Method and apparatus for inspecting defects of semiconductor device App 20070036421 - Toba; Tadanobu ; et al.	2007-02-15
Material feeding apparatus for rotary hearth furnace App 20060035193 - Shima; Shinji ; et al.	2006-02-16
Azo compound containing metal and optical recording medium using the compound App 20020015915 - Nagataki, Yoshiyuki ; et al.	2002-02-07
Optical recording medium App 20010053120 - Sakurai, Yuichi ; et al.	2001-12-20
Pigmented ink and process for production thereof Grant 6,113,680 - Aoyama , et al. September 5, 2	2000-09-05
Pigment ink for ink-jet recording Grant 6,013,124 - Saibara , et al. January 11, 2	2000-01-11

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