Sakurai; Seiji
Patent Applications and Registrations
Patent applications and USPTO patent grants for Sakurai; Seiji.The latest application filed is for "common test board, ip evaluation board, and semiconductor device test method".
- Sakurai; Seiji - Yokohama Kanagawa JP
- Sakurai; Seiji - Yokohama JP
- Sakurai; Seiji - Kanagawa JP
| Patent | Date |
|---|---|
| Common test board, IP evaluation board, and semiconductor device test method Grant 10,718,789 - Onda , et al. | 2020-07-21 |
| Common Test Board, Ip Evaluation Board, And Semiconductor Device Test Method App 20190004088 - Onda; Masato ; et al. | 2019-01-03 |
| Common test board, IP evaluation board, and semiconductor device test method Grant 10,101,359 - Onda , et al. October 16, 2 | 2018-10-16 |
| Common Test Board, Ip Evaluation Board, And Semiconductor Device Test Method App 20160266167 - Onda; Masato ; et al. | 2016-09-15 |
| Heating apparatus with multilayer insulating structure Grant 5,323,484 - Nakao , et al. June 21, 1 | 1994-06-21 |
| Heating apparatus Grant 5,229,576 - Nakao , et al. July 20, 1 | 1993-07-20 |
| Molding material Grant 4,755,228 - Sakurai , et al. July 5, 1 | 1988-07-05 |
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