SAKIYAMA; Shin
Patent Applications and Registrations
Patent applications and USPTO patent grants for SAKIYAMA; Shin.The latest application filed is for "cable assembly, connector and semiconductor tester".
- SAKIYAMA; Shin - Tokyo JP
- Sakiyama; Shin - Chiyoda-ku N/A JP
- Sakiyama; Shin - Saitama JP
| Patent | Date |
|---|---|
| Cable Assembly, Connector And Semiconductor Tester App 20160187413 - SUZUKI; Teruhito ; et al. | 2016-06-30 |
| Coaxial cable member coupled to a signal terminal, a ground terminal and an auxiliary ground conductor with an elastically-deformable piece Grant 9,170,276 - Suzuki , et al. October 27, 2 | 2015-10-27 |
| Connector and semiconductor testing device including the connector Grant 8,905,788 - Oniyama , et al. December 9, 2 | 2014-12-09 |
| Connector and semiconductor testing device including the connector Grant 8,860,454 - Oniyama , et al. October 14, 2 | 2014-10-14 |
| Connector, cable assembly, and semiconductor testing device Grant 8,790,134 - Motohashi , et al. July 29, 2 | 2014-07-29 |
| Connector and semiconductor test device Grant 8,657,625 - Wagata , et al. February 25, 2 | 2014-02-25 |
| Edge connector Grant 8,550,854 - Okano , et al. October 8, 2 | 2013-10-08 |
| Connector And Semiconductor Test Device App 20130189866 - Wagata; Hirotaka ; et al. | 2013-07-25 |
| Cable Assembly, Connector And Semiconductor Tester App 20130015873 - Suzuki; Teruhito ; et al. | 2013-01-17 |
| Connector And Semiconductor Testing Device Including The Connector App 20120126845 - Oniyama; Kyoko ; et al. | 2012-05-24 |
| Connector, Cable Assembly, And Semiconductor Testing Device App 20120094534 - Motohashi; Nobumasa ; et al. | 2012-04-19 |
| Connector And Semiconductor Testing Device Including The Connector App 20120088410 - Oniyama; Kyoko ; et al. | 2012-04-12 |
| Edge Connector App 20120088388 - Okano; Masato ; et al. | 2012-04-12 |
| Contact Probe And Socket, And Manufacturing Method Of Tube Plunger And Contact Probe App 20110221464 - Nagata; Takahiro ; et al. | 2011-09-15 |
| Electrical connector housing Grant D597,951 - Hatano , et al. August 11, 2 | 2009-08-11 |
| Board mount-type connector and board mount-type connector assembly Grant 7,544,067 - Hatano , et al. June 9, 2 | 2009-06-09 |
| Calibration Board For Electronic Device Test Apparatus App 20090128172 - Takaki; Shintaro ; et al. | 2009-05-21 |
| Electrical connector Grant D584,693 - Hatano , et al. January 13, 2 | 2009-01-13 |
| Contact terminal for measurement, measurement apparatus, probe card set, wafer probe apparatus, and testing apparatus Grant 7,474,109 - Kuitani , et al. January 6, 2 | 2009-01-06 |
| Electrical connector Grant D583,769 - Hatano , et al. December 30, 2 | 2008-12-30 |
| Electrical connector Grant D581,876 - Hatano , et al. December 2, 2 | 2008-12-02 |
| Socket and test apparatus App 20070145994 - Sakiyama; Shin | 2007-06-28 |
| Socket and test apparatus Grant 7,202,686 - Sakiyama April 10, 2 | 2007-04-10 |
| Socket for inspection apparatus App 20070007984 - Kojima; Yutaka ; et al. | 2007-01-11 |
| Contact terminal for measurement, measurement apparatus, probe card set, wafer probe apparatus, and testing apparatus App 20060279304 - Kuitani; Tetsuya ; et al. | 2006-12-14 |
| Socket and test apparatus App 20060121752 - Sakiyama; Shin | 2006-06-08 |
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