| Patent | Date |
|---|
Vibration Type Removal Apparatus
App 20220218384 - KOBAYASHI; Satoshi ; et al. | 2022-07-14 |
Measurement system and method for setting observation conditions of measurement apparatus
Grant 11,380,518 - Miwa , et al. July 5, 2 | 2022-07-05 |
Method For Producing Alpha-allylated Cycloalkanone
App 20220153671 - DEGUCHI; Jun ; et al. | 2022-05-19 |
Method For Producing Alpha-allylated Cycloalkanone
App 20220153672 - DEGUCHI; Jun ; et al. | 2022-05-19 |
Charged Particle Beam Device
App 20220102105 - Li; Wen ; et al. | 2022-03-31 |
Charged-particle beam apparatus
Grant 11,282,671 - Ikeda , et al. March 22, 2 | 2022-03-22 |
Charged particle beam apparatus
Grant 11,257,658 - Takahashi , et al. February 22, 2 | 2022-02-22 |
Electron Beam Observation Device, Electron Beam Observation System, and Image Correcting Method and Method for Calculating Correction Factor for Image Correction in Electron Beam Observation Device
App 20220051868 - HAMADA; Koichi ; et al. | 2022-02-17 |
Electron gun and electron beam application device
Grant 11,227,740 - Matsunaga , et al. January 18, 2 | 2022-01-18 |
Measurement System and Method for Setting Observation Conditions of Measurement Apparatus
App 20210407763 - MIWA; Takafumi ; et al. | 2021-12-30 |
Electron beam observation device, electron beam observation system, and control method of electron beam observation device
Grant 11,170,969 - Hamada , et al. November 9, 2 | 2021-11-09 |
Adhesive Application Apparatus
App 20210260833 - SAKAKIBARA; Makoto ; et al. | 2021-08-26 |
Scanning electron microscope and sample observation method using scanning electron microscope
Grant 11,011,348 - Bizen , et al. May 18, 2 | 2021-05-18 |
Electron Beam Observation Device, Electron Beam Observation System, And Control Method Of Electron Beam Observation Device
App 20210125806 - HAMADA; Koichi ; et al. | 2021-04-29 |
Electron beam device
Grant 10,825,649 - Sohda , et al. November 3, 2 | 2020-11-03 |
Image forming apparatus
Grant 10,755,396 - Enyama , et al. A | 2020-08-25 |
Electron Gun And Electron Beam Application Device
App 20200266020 - MATSUNAGA; Soichiro ; et al. | 2020-08-20 |
Measuring device and measuring method
Grant 10,707,047 - Takahashi , et al. | 2020-07-07 |
Charged-Particle Beam Apparatus
App 20200185189 - IKEDA; Uki ; et al. | 2020-06-11 |
Charged particle beam apparatus
Grant 10,636,618 - Bizen , et al. | 2020-04-28 |
Charged Particle Beam Apparatus
App 20200105501 - Takahashi; Noritsugu ; et al. | 2020-04-02 |
Scanning Electron Microscope And Sample Observation Method Using Scanning Electron Microscope
App 20190348255 - BIZEN; Daisuke ; et al. | 2019-11-14 |
Electron Beam Device
App 20190295805 - SOHDA; Yasunari ; et al. | 2019-09-26 |
Charged particle detector and charged particle beam device using the same
Grant 10,361,063 - Shirasaki , et al. | 2019-07-23 |
Measuring Device And Measuring Method
App 20190206654 - TAKAHASHI; Noritsugu ; et al. | 2019-07-04 |
Charged particle beam device
Grant 10,319,562 - Kimura , et al. | 2019-06-11 |
Charged Particle Beam Apparatus
App 20190066969 - BIZEN; Kaori ; et al. | 2019-02-28 |
Charged particle beam apparatus
Grant 10,217,604 - Sakakibara , et al. Feb | 2019-02-26 |
Duct and method of manufacturing the same
Grant 10,184,595 - Sakakibara , et al. Ja | 2019-01-22 |
Charged Particle Beam Apparatus
App 20180286629 - SAKAKIBARA; Makoto ; et al. | 2018-10-04 |
Charged Particle Beam Device
App 20180261426 - KIMURA; Megumi ; et al. | 2018-09-13 |
Charged Particle Detector and Charged Particle Beam Device Using the Same
App 20180261425 - SHIRASAKI; Yasuhiro ; et al. | 2018-09-13 |
Image Forming Apparatus
App 20180232869 - ENYAMA; Momoyo ; et al. | 2018-08-16 |
Scanning electron microscope and method for controlling same
Grant 10,014,160 - Shirahata , et al. July 3, 2 | 2018-07-03 |
Charged particle beam device, simulation method, and simulation device
Grant 9,966,225 - Bizen , et al. May 8, 2 | 2018-05-08 |
Charged Particle Beam Device, Simulation Method, And Simulation Device
App 20170213695 - BIZEN; Daisuke ; et al. | 2017-07-27 |
Scanning Electron Microscope And Method For Controlling Same
App 20170186583 - SHIRAHATA; Kaori ; et al. | 2017-06-29 |
Duct And Method Of Manufacturing The Same
App 20170122466 - SAKAKIBARA; Makoto ; et al. | 2017-05-04 |
Pattern critical dimension measurement equipment and method for measuring pattern critical dimension
Grant 9,520,266 - Shirahata , et al. December 13, 2 | 2016-12-13 |
Charged particle beam apparatus
Grant 9,287,082 - Morita , et al. March 15, 2 | 2016-03-15 |
Two-pack Curable Polyorganosiloxane Composition And Use Thereof
App 20150337188 - SAKAKIBARA; Makoto ; et al. | 2015-11-26 |
Charged Particle Beam Apparatus
App 20150228443 - MORITA; Kenichi ; et al. | 2015-08-13 |
Pattern Critical Dimension Measurement Equipment And Method For Measuring Pattern Critical Dimension
App 20150041648 - Shirahata; Kaori ; et al. | 2015-02-12 |
Electron Beam Apparatus And Lens Array
App 20130248731 - TANIMOTO; Sayaka ; et al. | 2013-09-26 |
Abnormality determination and estimation method, and abnormality determination and estimation device for weld product
Grant 7,939,780 - Murao , et al. May 10, 2 | 2011-05-10 |
Measurement method of electron beam current, electron beam writing system and electron beam detector
Grant 7,425,714 - Sakakibara , et al. September 16, 2 | 2008-09-16 |
Electron beam writing system and electron beam writing method
Grant 7,423,274 - Nakayama , et al. September 9, 2 | 2008-09-09 |
Heat Curable Adhesive Composition, Article, Semiconductor Apparatus And Method
App 20080090085 - Kawate; Kohichiro ; et al. | 2008-04-17 |
Water-based Inks For Ink-jet Printing
App 20070144399 - Nagashima; Shigeki ; et al. | 2007-06-28 |
Abnormality determination and estimation method, and abnormality determination and estimation device for weld product
App 20070090098 - Murao; Masuaki ; et al. | 2007-04-26 |
Water-based ink
Grant 7,112,619 - Sakakibara , et al. September 26, 2 | 2006-09-26 |
Electron beam writing system and electron beam writing method
App 20060197453 - Nakayama; Yoshinori ; et al. | 2006-09-07 |
Measurement method of electron beam current, electron beam writing system and electron beam detector
App 20060060775 - Sakakibara; Makoto ; et al. | 2006-03-23 |
Measurement method of electron beam current, electron beam lithography method and system
App 20060011869 - Tanaka; Noriyuki ; et al. | 2006-01-19 |
Heat curable adhesive composition, article, semiconductor apparatus and method
App 20050224978 - Kawate, Kohichiro ; et al. | 2005-10-13 |
Corrosion resistant member
Grant 6,858,321 - Wada , et al. February 22, 2 | 2005-02-22 |
Water-based ink
App 20040132942 - Sakakibara, Makoto ; et al. | 2004-07-08 |
Water-based ink
Grant 6,730,780 - Wakabayashi , et al. May 4, 2 | 2004-05-04 |
| 