SAKAIRI; Hiroyuki
Patent Applications and Registrations
Patent applications and USPTO patent grants for SAKAIRI; Hiroyuki.The latest application filed is for "semiconductor device".
- SAKAIRI; Hiroyuki - Kyoto-shi Kyoto
- Sakairi; Hiroyuki - Kyoto JP
| Patent | Date |
|---|---|
| Semiconductor Device App 20220005753 - YAMAGUCHI; Atsushi ; et al. | 2022-01-06 |
| Semiconductor Device App 20210343629 - SAITO; Koshun ; et al. | 2021-11-04 |
| Semiconductor device Grant 11,081,433 - Saito , et al. August 3, 2 | 2021-08-03 |
| Switching Device App 20210234472 - NAKANO; Yuki ; et al. | 2021-07-29 |
| Switching device Grant 11,005,387 - Nakano , et al. May 11, 2 | 2021-05-11 |
| Method For Measuring Current-voltage Characteristic App 20210132136 - YANAGI; Tatsuya ; et al. | 2021-05-06 |
| Method for measuring current-voltage characteristic Grant 10,908,204 - Yanagi , et al. February 2, 2 | 2021-02-02 |
| Method for measuring current-voltage characteristic Grant 10,901,024 - Yanagi , et al. January 26, 2 | 2021-01-26 |
| Semiconductor Device App 20200365497 - SAITO; Koshun ; et al. | 2020-11-19 |
| Switching Device App 20200212820 - NAKANO; Yuki ; et al. | 2020-07-02 |
| Switching device Grant 10,630,199 - Nakano , et al. | 2020-04-21 |
| Semiconductor device Grant 10,580,852 - Nakano , et al. | 2020-03-03 |
| Semiconductor Device App 20190259828 - NAKANO; Yuki ; et al. | 2019-08-22 |
| Switching Device App 20190260305 - NAKANO; Yuki ; et al. | 2019-08-22 |
| Switching device Grant 10,320,309 - Nakano , et al. | 2019-06-11 |
| Semiconductor device Grant 10,312,320 - Nakano , et al. | 2019-06-04 |
| Method For Measuring Current-voltage Characteristic App 20180188312 - YANAGI; Tatsuya ; et al. | 2018-07-05 |
| Semiconductor Device App 20180175139 - NAKANO; Yuki ; et al. | 2018-06-21 |
| Switching Device App 20180138824 - NAKANO; Yuki ; et al. | 2018-05-17 |
| Semiconductor device Grant 9,911,844 - Nakano , et al. March 6, 2 | 2018-03-06 |
| Switching device Grant 9,866,143 - Nakano , et al. January 9, 2 | 2018-01-09 |
| Method For Measuring Current-voltage Characteristic App 20170285095 - YANAGI; Tatsuya ; et al. | 2017-10-05 |
| Semiconductor device and semiconductor device manufacturing method Grant 9,536,998 - Nakano , et al. January 3, 2 | 2017-01-03 |
| Switching Device App 20160344303 - NAKANO; Yuki ; et al. | 2016-11-24 |
| Semiconductor Device App 20160260830 - NAKANO; Yuki ; et al. | 2016-09-08 |
| Switching device Grant 9,437,592 - Nakano , et al. September 6, 2 | 2016-09-06 |
| Semiconductor device Grant 9,368,616 - Nakano , et al. June 14, 2 | 2016-06-14 |
| Semiconductor device Grant 9,337,257 - Nakano , et al. May 10, 2 | 2016-05-10 |
| Semiconductor Device App 20150333120 - NAKANO; Yuki ; et al. | 2015-11-19 |
| Switching Device App 20150325571 - NAKANO; Yuki ; et al. | 2015-11-12 |
| Semiconductor Device And Semiconductor Device Manufacturing Method App 20150295079 - Nakano; Yuki ; et al. | 2015-10-15 |
| Switching device Grant 9,117,800 - Nakano , et al. August 25, 2 | 2015-08-25 |
| Semiconductor Device App 20150214355 - Nakano; Yuki ; et al. | 2015-07-30 |
| Semiconductor Device App 20150214354 - Nakano; Yuki ; et al. | 2015-07-30 |
| Switching Device App 20140103364 - NAKANO; Yuki ; et al. | 2014-04-17 |
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