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name:-0.042233943939209
name:-0.024796009063721
name:-0.015666961669922
SAKAI; Kei Patent Filings

SAKAI; Kei

Patent Applications and Registrations

Patent applications and USPTO patent grants for SAKAI; Kei.The latest application filed is for "measurement system, method for generating learning model to be used when performing image measurement of semiconductor including predetermined structure, and recording medium for storing program for causing computer to execute processing for generating learning model to be used when performing image".

Company Profile
14.27.29
  • SAKAI; Kei - Tokyo JP
  • Sakai; Kei - Yokohama N/A JP
  • Sakai; Kei - Heverlee BE
  • Sakai; Kei - Hitachinaka JP
  • Sakai; Kei - Yokohama-shi JP
  • Sakai; Kei - Kanagawa JP
  • Sakai; Kei - Kanagawa-Ken JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Measurement System, Method for Generating Learning Model to Be Used When Performing Image Measurement of Semiconductor Including Predetermined Structure, and Recording Medium for Storing Program for Causing Computer to Execute Processing for Generating Learning Model to Be Used When Performing Image
App 20220277434 - YUMIBA; Ryou ;   et al.
2022-09-01
Pattern Measurement System, Pattern Measurement Method, and Program
App 20220230281 - Kameda; Toshimasa ;   et al.
2022-07-21
Charged Particle Beam Device
App 20220165537 - HOMMI; Motonobu ;   et al.
2022-05-26
Charged Particle Beam Device
App 20220130638 - HITOMI; Keiichiro ;   et al.
2022-04-28
Electron Beam Observation Device, Electron Beam Observation System, and Image Correcting Method and Method for Calculating Correction Factor for Image Correction in Electron Beam Observation Device
App 20220051868 - HAMADA; Koichi ;   et al.
2022-02-17
Pattern measurement device and non-transitory computer readable medium having stored therein program for executing measurement
Grant 11,177,112 - Yamaguchi , et al. November 16, 2
2021-11-16
Electron beam observation device, electron beam observation system, and control method of electron beam observation device
Grant 11,170,969 - Hamada , et al. November 9, 2
2021-11-09
Electron beam device and image processing method
Grant 11,011,346 - Hamada , et al. May 18, 2
2021-05-18
Electron Beam Observation Device, Electron Beam Observation System, And Control Method Of Electron Beam Observation Device
App 20210125806 - HAMADA; Koichi ;   et al.
2021-04-29
Charged particle beam device for imaging vias inside trenches
Grant 10,984,980 - Sakai , et al. April 20, 2
2021-04-20
Image-forming device, and dimension measurement device
Grant 10,976,536 - Takasugi , et al. April 13, 2
2021-04-13
Pattern Measurement Device and Non-Transitory Computer Readable Medium Having Stored Therein Program for Executing Measurement
App 20200411281 - YAMAGUCHI; Satoru ;   et al.
2020-12-31
Electron Beam Device And Image Processing Method
App 20200303159 - HAMADA; Koichi ;   et al.
2020-09-24
Image-Forming Device, and Dimension Measurement Device
App 20200201019 - TAKASUGI; Yasunori ;   et al.
2020-06-25
Charged particle beam apparatus
Grant 10,665,420 - Takasugi , et al.
2020-05-26
Image-forming device, and dimension measurement device
Grant 10,620,421 - Takasugi , et al.
2020-04-14
Overlay error measuring device and computer program for causing computer to measure pattern
Grant 10,545,017 - Yamaguchi , et al. Ja
2020-01-28
Charged Particle Beam Apparatus
App 20190295815 - TAKASUGI; Yasunori ;   et al.
2019-09-26
Pattern measurement apparatus and defect inspection apparatus
Grant 10,417,756 - Sakai , et al. Sept
2019-09-17
Image-Forming Device, and Dimension Measurement Device
App 20190121113 - TAKASUGI; Yasunori ;   et al.
2019-04-25
Image-forming device, and dimension measurement device
Grant 10,197,783 - Takasugi , et al. Fe
2019-02-05
Charged Particle Beam Device
App 20190035600 - SAKAI; Kei ;   et al.
2019-01-31
Pattern Measurement Apparatus and Flaw Inspection Apparatus
App 20180012349 - SAKAI; Kei ;   et al.
2018-01-11
Method for pattern measurement, method for setting device parameters of charged particle radiation device, and charged particle radiation device
Grant 9,831,062 - Suzuki , et al. November 28, 2
2017-11-28
Electrocatalyst for solid polymer fuel cell
Grant 9,799,903 - Iden , et al. October 24, 2
2017-10-24
Pattern measurement device, evaluation method of polymer compounds used in self-assembly lithography, and computer program
Grant 9,589,343 - Isawa , et al. March 7, 2
2017-03-07
Semiconductor circuit pattern measuring apparatus and method
Grant 9,336,587 - Shibahara , et al. May 10, 2
2016-05-10
Method for Pattern Measurement, Method for Setting Device Parameters of Charged Particle Radiation Device, and Charged Particle Radiation Device
App 20150357158 - SUZUKI; Makoto ;   et al.
2015-12-10
Overlay Error Measuring Device And Computer Program For Causing Computer To Measure Pattern
App 20150285627 - Yamaguchi; Satoru ;   et al.
2015-10-08
Specimen potential measuring method, and charged particle beam device
Grant 9,129,775 - Ishijima , et al. September 8, 2
2015-09-08
Pattern Measurement Device, Evaluation Method of Polymer Compounds Used in Self-Assembly Lithography, and Computer Program
App 20150243008 - Isawa; Miki ;   et al.
2015-08-27
Gas diffusion electrode and production method for same; membrane electrode assembly and production method for same
Grant 9,029,045 - Satou , et al. May 12, 2
2015-05-12
Pattern measuring apparatus
Grant 9,024,272 - Sakai , et al. May 5, 2
2015-05-05
Image-Forming Device, and Dimension Measurement Device
App 20150002652 - Takasugi; Yasunori ;   et al.
2015-01-01
Electrocatalyst for Solid Polymer Fuel Cell
App 20140199609 - Iden; Hiroshi ;   et al.
2014-07-17
Semiconductor Circuit Pattern Measuring Apparatus And Method
App 20140003703 - SHIBAHARA; Takuma ;   et al.
2014-01-02
Pattern-searching condition determining method, and pattern-searching condition setting device
Grant 8,478,078 - Sakai , et al. July 2, 2
2013-07-02
Pattern Measuring Apparatus and Computer Program
App 20120267528 - Sakai; Kei ;   et al.
2012-10-25
Specimen Potential Measuring Method, And Charged Particle Beam Device
App 20120119085 - Ishijima; Tatsuaki ;   et al.
2012-05-17
Hydrophilic Porous Layer For Fuel Cells, Gas Diffusion Electrode And Manufacturing Method Thereof, And Membrane Electrode Assembly
App 20120100461 - Iden; Hiroshi ;   et al.
2012-04-26
Gas Diffusion Electrode And Production Method For Same; Membrane Electrode Assembly And Production Method For Same
App 20120094215 - Satou; Kazuyuki ;   et al.
2012-04-19
Pattern-searching Condition Determining Method, And Pattern-searching Condition Setting Device
App 20110194778 - Sakai; Kei ;   et al.
2011-08-11
Method and device for integrative control of gas engine
Grant 7,747,378 - Shiraishi , et al. June 29, 2
2010-06-29
Method and device for controlling starting of gas engine
Grant 7,654,247 - Shiraishi , et al. February 2, 2
2010-02-02
Method and device for integrative control of gas engine
Grant 7,650,222 - Shiraishi , et al. January 19, 2
2010-01-19
Method and device for integrative control of gas engine
Grant 7,650,223 - Shiraishi , et al. January 19, 2
2010-01-19
Method and device for integrative control of gas engine
App 20090071439 - Shiraishi; Masataka ;   et al.
2009-03-19
Method and device for controlling starting of gas engine
App 20090071438 - Shiraishi; Masataka ;   et al.
2009-03-19
Method and device for integrative control of gas engine
App 20090076708 - Shiraishi; Masataka ;   et al.
2009-03-19
Method and device for integrative control of gas engine
App 20090076709 - Shiraishi; Masataka ;   et al.
2009-03-19

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