SAKAI; Kaoru

Patent Applications and Registrations

Patent applications and USPTO patent grants for SAKAI; Kaoru.The latest application filed is for "ultrasonic testing device and ultrasonic testing method".

Company Profile

6.59.61

SAKAI; Kaoru - Tokyo JP
SAKAI; Kaoru - Hyogo JP
Sakai; Kaoru - Yokohama N/A JP
Sakai; Kaoru - Indianapolis IN
Sakai; Kaoru - Kyoto JP
Sakai; Kaoru - Hitachi JA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Ultrasonic Testing Device and Ultrasonic Testing Method App 20220283124 - SAKAI; Kaoru ; et al.	2022-09-08
Defect inspection method and apparatus Grant 10,529,068 - Sakai , et al. J	2020-01-07
Defect inspection method and apparatus Grant 10,354,372 - Sakai , et al. July 16, 2	2019-07-16
Defect Inspection Method And Apparatus App 20190197680 - SAKAI; Kaoru ; et al.	2019-06-27
Method For Treating Solution Contaminated With Porcine Circoviruses App 20190167823 - YUNOKI; Mikihiro ; et al.	2019-06-06
Defect Inspection Method And Apparatus App 20190050978 - SAKAI; Kaoru ; et al.	2019-02-14
Defect Inspection Method And Apparatus App 20180101944 - SAKAI; Kaoru ; et al.	2018-04-12
Shape Examination Method And Device Therefor App 20150362310 - TANIGUCHI; Atsushi ; et al.	2015-12-17
Defect inspection device and defect inspection method Grant 9,075,026 - Urano , et al. July 7, 2	2015-07-07
Method and apparatus for inspecting patterns formed on a substrate Grant 8,824,774 - Sakai , et al. September 2, 2	2014-09-02
Defect inspection method and device thereof Grant 8,811,712 - Maeda , et al. August 19, 2	2014-08-19
Defect inspection method and apparatus Grant 8,755,041 - Urano , et al. June 17, 2	2014-06-17
Apparatus and method for inspecting defect Grant 8,737,718 - Sakai , et al. May 27, 2	2014-05-27
Method and apparatus for inspecting pattern defects Grant 8,639,019 - Sakai , et al. January 28, 2	2014-01-28
Defect Inspection Method And Apparatus App 20130343632 - URANO; Yuta ; et al.	2013-12-26
Defect Inspection Method And Device Thereof App 20130329039 - Sakai; Kaoru	2013-12-12
Method And Apparatus For Inspecting Patterns Formed On A Substrate App 20130307963 - SAKAI; Kaoru ; et al.	2013-11-21
Fault inspection method Grant 8,582,864 - Maeda , et al. November 12, 2	2013-11-12
Method and apparatus for inspecting patterns formed on a substrate Grant 8,467,594 - Sakai , et al. June 18, 2	2013-06-18
Defect inspection method and apparatus Grant 8,427,634 - Urano , et al. April 23, 2	2013-04-23
Method And Apparatus For Inspecting Pattern Defects App 20130004057 - SAKAI; Kaoru ; et al.	2013-01-03
Method And Apparatus For Pattern Inspection App 20130002849 - SAKAI; Kaoru ; et al.	2013-01-03
Defect inspection method and apparatus therefor Grant 8,340,395 - Sakai , et al. December 25, 2	2012-12-25
Defect Inspection Method And Device Thereof App 20120294507 - Sakai; Kaoru ; et al.	2012-11-22
Defect inspection system and method of the same Grant 8,274,652 - Urano , et al. September 25, 2	2012-09-25
Method and apparatus for inspecting pattern defects Grant 8,275,190 - Sakai , et al. September 25, 2	2012-09-25
Method and apparatus for pattern inspection Grant 8,270,700 - Sakai , et al. September 18, 2	2012-09-18
Defect Inspection Device And Defect Inspection Method App 20120229618 - Urano; Takahiro ; et al.	2012-09-13
Method and apparatus for inspecting a pattern formed on a substrate Grant 8,253,934 - Yoshida , et al. August 28, 2	2012-08-28
Fault Inspection Method App 20120207382 - Maeda; Shunji ; et al.	2012-08-16
Method and apparatus for calculating game outcomes Grant 8,216,044 - Sakai July 10, 2	2012-07-10
Apparatus And Method For Inspecting Defect App 20120141012 - Sakai; Kaoru ; et al.	2012-06-07
Pattern Inspection Method And Its Apparatus App 20120076396 - SAKAI; Kaoru ; et al.	2012-03-29
Fault inspection method Grant 8,103,087 - Maeda , et al. January 24, 2	2012-01-24
Method And Apparatus For Inspecting Patterns Formed On A Substrate App 20120002860 - SAKAI; Kaoru ; et al.	2012-01-05
Pattern inspection method and its apparatus Grant 8,090,187 - Sakai , et al. January 3, 2	2012-01-03
Defect Inspecting Apparatus And Defect Inspecting Method App 20110311126 - Sakai; Kaoru ; et al.	2011-12-22
Method And Apparatus For Inspecting Pattern Defects App 20110304725 - SAKAI; Kaoru ; et al.	2011-12-15
Defect Inspection Method And Device Thereof App 20110274342 - Maeda; Shunji ; et al.	2011-11-10
Method and apparatus for inspecting pattern defects Grant 8,005,292 - Sakai , et al. August 23, 2	2011-08-23
Defect Check Method And Device Thereof App 20110182496 - Sakai; Kaoru ; et al.	2011-07-28
Pattern inspection method and its apparatus Grant 7,949,178 - Sakai , et al. May 24, 2	2011-05-24
Method and apparatus for inspecting pattern defects Grant 7,903,249 - Yoshida , et al. March 8, 2	2011-03-08
Inspection method and its apparatus, inspection system Grant 7,869,966 - Okabe , et al. January 11, 2	2011-01-11
Method And Apparatus For Inspecting Pattern Defects App 20100328446 - SAKAI; Kaoru ; et al.	2010-12-30
Method and apparatus for inspecting a defect of a pattern Grant 7,848,563 - Sakai , et al. December 7, 2	2010-12-07
Method and apparatus for inspecting pattern defects Grant 7,792,352 - Sakai , et al. September 7, 2	2010-09-07
Defect Inspection Method And Apparatus App 20100182602 - URANO; Yuta ; et al.	2010-07-22
Pattern Inspection Method And Its Apparatus App 20100172570 - SAKAI; Kaoru ; et al.	2010-07-08
Pattern inspection method and its apparatus Grant 7,711,178 - Sakai , et al. May 4, 2	2010-05-04
Method And Apparatus For Inspecting A Pattern Formed On A Substrate App 20100104173 - Yoshida; Minoru ; et al.	2010-04-29
Agent for prophylactic and/or therapeutic treatment of diabetes App 20100055066 - Suzuki; Kazuo ; et al.	2010-03-04
Method and apparatus for pattern inspection App 20100053319 - Sakai; Kaoru ; et al.	2010-03-04
Defect inspection method and apparatus Grant 7,664,608 - Urano , et al. February 16, 2	2010-02-16
Method and apparatus for inspecting a pattern formed on a substrate Grant 7,646,477 - Yoshida , et al. January 12, 2	2010-01-12
Defect Inspection Method and Apparatus Therefor App 20090290783 - SAKAI; Kaoru ; et al.	2009-11-26
Method and apparatus for pattern inspection Grant 7,620,232 - Sakai , et al. November 17, 2	2009-11-17
Pattern Inspection Method And Its Apparatus App 20090226076 - Sakai; Kaoru ; et al.	2009-09-10
Pattern Inspection Method And Its Apparatus App 20090169093 - Sakai; Kaoru ; et al.	2009-07-02
Method And Apparatus For Inspecting Pattern Defects App 20090153840 - Yoshida; Minoru ; et al.	2009-06-18
Method and apparatus for inspecting pattern defects Grant 7,489,395 - Yoshida , et al. February 10, 2	2009-02-10
Pattern inspection method and its apparatus App 20090003682 - Sakai; Kaoru ; et al.	2009-01-01
Non-destructive inspection method and apparatus therefor Grant 7,462,827 - Asano , et al. December 9, 2	2008-12-09
Defect Inspection System And Method Of The Same App 20080297783 - URANO; Yuta ; et al.	2008-12-04
Pattern inspection method and pattern inspection apparatus App 20080292176 - Sakai; Kaoru ; et al.	2008-11-27
Pattern inspection method and its apparatus Grant 7,433,508 - Sakai , et al. October 7, 2	2008-10-07
Method And Apparatus For Inspecting Pattern Defects App 20080232674 - Sakai; Kaoru ; et al.	2008-09-25
Method and apparatus for inspecting pattern defects Grant 7,388,979 - Sakai , et al. June 17, 2	2008-06-17
Image alignment method, comparative inspection method, and comparative inspection device for comparative inspections Grant 7,333,677 - Sakai , et al. February 19, 2	2008-02-19
Method and apparatus for inspecting defects Grant 7,330,248 - Sakai , et al. February 12, 2	2008-02-12
Pattern Inspection Method And Its Apparatus App 20080031511 - Sakai; Kaoru ; et al.	2008-02-07
Defect Inspection Method and Apparatus App 20080015802 - Urano; Yuta ; et al.	2008-01-17
Nerve Growth Factor Production Inhibitor and External Preparation for the Skin, Cosmetic, Quasi Drug, Preventive and Remedy for Atopic Dermatitis Containing the Nerve Growth Factor Production Inhibitor App 20070286915 - Tonogaito; Hiroshi ; et al.	2007-12-13
Fault inspection method App 20070177787 - Maeda; Shunji ; et al.	2007-08-02
Image Alignment Method, Comparative Inspection Method, and Comparative Inspection Device for Comparative Inspections App 20070133863 - Sakai; Kaoru ; et al.	2007-06-14
Nondestructive inspection method and apparatus Grant 7,215,807 - Nomoto , et al. May 8, 2	2007-05-08
Image alignment method, comparative inspection method, and comparative inspection device for comparative inspections App 20070036422 - Sakai; Kaoru ; et al.	2007-02-15
Method and apparatus for inspecting pattern defects App 20070002318 - Yoshida; Minoru ; et al.	2007-01-04
Defect detection method and its apparatus Grant 7,142,708 - Sakai , et al. November 28, 2	2006-11-28
Image alignment method, comparative inspection method, and comparative inspection device for comparative inspections Grant 7,127,126 - Sakai , et al. October 24, 2	2006-10-24
Method and apparatus for inspecting pattern defects Grant 7,110,105 - Yoshida , et al. September 19, 2	2006-09-19
Method and apparatus for inspecting a defect of a pattern App 20060159330 - Sakai; Kaoru ; et al.	2006-07-20
Image alignment method, comparative inspection method, and comparative inspection device for comparative inspections Grant 7,020,350 - Sakai , et al. March 28, 2	2006-03-28
Non-destructive inspection method and apparatus therefor App 20060033986 - Asano; Toshio ; et al.	2006-02-16
Method and apparatus for pattern inspection App 20060002604 - Sakai; Kaoru ; et al.	2006-01-05
Method and apparatus for non-destructive testing Grant 6,975,391 - Asano , et al. December 13, 2	2005-12-13
Method and apparatus for inspecting pattern defects App 20050264800 - Yoshida, Minoru ; et al.	2005-12-01
Nondestructive inspection method and apparatus App 20050259861 - Nomoto, Mineo ; et al.	2005-11-24
Image alignment method, comparative inspection method, and comparative inspection device for comparative inspections App 20050220333 - Sakai, Kaoru ; et al.	2005-10-06
Nondestructive inspection method and apparatus Grant 6,950,545 - Nomoto , et al. September 27, 2	2005-09-27
Method and apparatus for inspecting a pattern formed on a substrate App 20050206888 - Yoshida, Minoru ; et al.	2005-09-22
Method and apparatus for inspecting pattern defects Grant 6,927,847 - Yoshida , et al. August 9, 2	2005-08-09
Method and apparatus for inspecting defects App 20050168730 - Sakai, Kaoru ; et al.	2005-08-04
Method and apparatus for inspecting pattern defects App 20050147287 - Sakai, Kaoru ; et al.	2005-07-07
Method and apparatus for inspecting a pattern formed on a substrate Grant 6,900,888 - Yoshida , et al. May 31, 2	2005-05-31
Method and apparatus for inspecting defects Grant 6,879,392 - Sakai , et al. April 12, 2	2005-04-12
Inspection method and its apparatus, inspection system App 20050033538 - Okabe, Takafumi ; et al.	2005-02-10
Method for detecting a defect in a pixel of an electrical display unit and a method for manufacturing an electrical display unit Grant 6,831,995 - Asano , et al. December 14, 2	2004-12-14
Pattern inspection method and its apparatus App 20040240723 - Sakai, Kaoru ; et al.	2004-12-02
Inspection method and its apparatus, inspection system Grant 6,799,130 - Okabe , et al. September 28, 2	2004-09-28
Method and apparatus for inspecting a pattern formed on a substrate App 20040124363 - Yoshida, Minoru ; et al.	2004-07-01
Pattern inspection method and its apparatus App 20030179921 - Sakai, Kaoru ; et al.	2003-09-25
Method and apparatus for inspecting pattern defects App 20030048439 - Yoshida, Minoru ; et al.	2003-03-13
Inspection method and its apparatus, inspection system App 20030050761 - Okabe, Takafumi ; et al.	2003-03-13
Method and apparatus for inspecting defects App 20030025904 - Sakai, Kaoru ; et al.	2003-02-06
Defect detection method and its apparatus App 20030021462 - Sakai, Kaoru ; et al.	2003-01-30
Image alignment method, comparative inspection method, and comparative inspection device for comparative inspections App 20010053245 - Sakai, Kaoru ; et al.	2001-12-20
Chip resistor and method of making the same Grant 6,153,256 - Kambara , et al. November 28, 2	2000-11-28
Purification method for hydrophobic polypeptide Grant 5,648,457 - Takei , et al. July 15, 1	1997-07-15
Method of manfacturing a chip-type composite electronic part Grant 5,502,885 - Hanamura , et al. April 2, 1	1996-04-02
Sample transfer device and method for analytical system Grant 3,929,411 - Takano , et al. December 30, 1	1975-12-30